Isbn: 9789080427617 - testing semiconductor memories: theory and practice (6 resultados)
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Librería: BoundlessBookstore, Wallingford, Reino UnidoBoundlessBookstore
Contactar con el vendedorVendedor de 5 estrellasCondición: Usado - Aceptable
EUR 96,96
Envío por EUR 8,21Se envía de Reino Unido a Estados Unidos de AmericaCantidad disponible: 1 disponible
Hardcover. Condición: Good. Good condition book without dust jacket. Boards are clean with light wear, fading to spine. Book has clean with slight age tone.

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- Primera edición
Librería: About Books, Henderson, NV, Estados Unidos de AmericaAbout Books
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EUR 99,73
Envío por EUR 6,18Se envía dentro de Estados Unidos de AmericaCantidad disponible: 1 disponible
Hardcover. Condición: Very Good condition. Estado de la sobrecubierta: No dust jacket, as issued. 1st ed? (No additional printings listed. Gouda, The Netherlands: A. J. van de Goor, 1998. Very Good condition. NO chips, tears or fading. We have only this 1 but it is available to ship TODAY from Henderson, Nevada. NO owner's name or bookplate. NOT a library discard. Pages are clean and unmarked. NO underlining. NO highlighting. NO margin notes. Bound in the original green laminated boards. "Goor (EE, Delft U.) presents memory test models on the chip, array, and board level. For each a class of fault models is introduced together with opposite tests. He particularly stresses the appropriateness of fault models to their class." -- Annotation copyright Book News, Inc. Portland, Or. GoodReads rating: 4.50 stars. From an AI overview: "Testing Semiconductor Memories: Theory and Practice is a comprehensive reference book written by A. J. van de Goor and published in 1991 [this edition 1998]. Book Overview: Author: A.J. van de Goor (Delft University of Technology). Length: 512 pages. Primary Focus: Testing and fault modeling of memory devices across chip, array, and board levels. Key Topics Covered: Memory Architectures: Recaps reliability theory and details static RAM (SRAM) and dynamic RAM (DRAM) cell structures and peripheral circuitry. Fault Models: Introduces major failure modes, including Stuck-at faults, Transition faults, Coupling faults, and Neighbourhood Pattern Sensitive faults (NPSFs).Test Algorithms: Provides functional testing algorithms alongside mathematical proofs for their correctness." NO software included with this 1998 edition. . 1st ed? (No additional printings listed. Hardcover. Very Good condition/No dust jacket, as issued. Illus. by NOT a library discard. 8vo. xxiv, 512pp. Great Packaging, Fast Shipping. NOT a library discard (ilustrador).…

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Librería: HPB-Red, Dallas, TX, Estados Unidos de AmericaHPB-Red
Contactar con el vendedorVendedor de 5 estrellasCondición: Usado - Regular
EUR 105,36
Envío por EUR 3,33Se envía dentro de Estados Unidos de AmericaCantidad disponible: 1 disponible
Hardcover. Condición: Acceptable. Connecting readers with great books since 1972. Used textbooks may not include companion materials such as access codes, etc. May have condition issues including wear and notes/highlighting. We ship orders daily and Customer Service is our top priority.

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Librería: HPB-Red, Dallas, TX, Estados Unidos de AmericaHPB-Red
Contactar con el vendedorVendedor de 5 estrellasCondición: Usado - Aceptable
EUR 105,36
Envío por EUR 3,33Se envía dentro de Estados Unidos de AmericaCantidad disponible: 1 disponible
Hardcover. Condición: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority.

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Librería: Mispah books, Redhill, SURRE, Reino UnidoMispah books
Contactar con el vendedorVendedor de 4 estrellasCondición: Usado - Aceptable
EUR 275,12
Envío por EUR 29,42Se envía de Reino Unido a Estados Unidos de AmericaCantidad disponible: 1 disponible
hardcover. Condición: Good. Good. Dust Jacket NOT present. CD WILL BE MISSING. . SHIPS FROM MULTIPLE LOCATIONS. book.

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Librería: Rob the Book Man, Vancouver, WA, Estados Unidos de AmericaRob the Book Man
Contactar con el vendedorVendedor de 4 estrellasCondición: Usado - Bueno
EUR 389,03
Envío por EUR 6,21Se envía dentro de Estados Unidos de AmericaCantidad disponible: 1 disponible
Hardcover. Condición: Very Good. Hardback in very good + condition.