9787560336480 - 半导体物理与测试分析 (1 resultados)
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Librería: liu xing, Nanjing, JS, Chinaliu xing
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EUR 48,76
Envío por EUR 15,40Se envía de China a Estados Unidos de AmericaCantidad disponible: 1 disponibles
paperback. Condición: New. Paperback. Pub Date: 2012 08 Pages: 152 Language: Chinese in Publisher: Harbin Institute of Technology Electronics and Communication Engineering Series: semiconductor physics test analysis more comprehensive introduction to the basics of semiconductor physics test analysis. Mainly includes: the basic n…ature of the semiconductor; semiconductor impurity and defect levels. and silicon dislocations and stacking fault observed; statistical distribution of the carriers in the equilibrium state semi.
