9787302374442 (1 resultados)
- Tapa blanda
Librería: liu xing, Nanjing, JS, Chinaliu xing
Contactar con el vendedorVendedor de 5 estrellasCondición: Nuevo
EUR 64,18
Envío por EUR 15,85Se envía de China a Estados Unidos de AmericaCantidad disponible: 5 disponibles
paperback. Condición: New. Pub Date: 2014-09-01 Language: Chinese Publisher: Tsinghua University Press' material modern testing methods. including X-ray diffraction analysis. electron microscopy analysis of two parts. the main contents include: X-ray diffraction equation and strength. and more crystal X-ray diffraction analysis…methods and analyzer. qualitative and quantitative phase analysis. to accurately determine the crystal lattice parameters. TEM imaging principle structure. electron diffraction. image contrast. .
