Isbn: 9787121033711 - computer rank examination test center analysis of the problem solution and simulation: two java language(chinese edition) (1 resultados)
Editorial: Electronics Industry Pub. Date :2007-01-01 version 1, 2000
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Librería: liu xing, Nanjing, JS, Chinaliu xing
Contactar con el vendedorVendedor de 5 estrellasCondición: Nuevo
EUR 62,58
Envío por EUR 15,87Se envía de China a Estados Unidos de AmericaCantidad disponible: 1 disponible
paperback. Condición: New. Paperback. Pub Date: 2007 Pages: 318 Publisher: Electronic Industry Press book written by Greek race the IT education R & D center organizations. closely linked to the the NEEA new examination syllabus through calendar year questions for scientific analysis. summary extracted from. The book exam guide and test center analysis and synchronization of training. five sets of written examination papers full simulation and analytic guidance of the computer-based test. 10 sets of machine test all tr.…
