Isbn: 9787115521279 - c 陷阱与缺陷 (1 resultados)

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  • Idioma: Chino

    Editorial: People Post Press, 2020

    7115521271 / 9787115521279

    • Tapa blanda

    Librería: liu xing, Nanjing, JS, Chinaliu xing

    Vendedor de 5 estrellas
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    Condición: Nuevo

    EUR 78,21

    Envío por EUR 15,72 
    Se envía de China a Estados Unidos de America

    Cantidad disponible: 3 disponibles

    paperback. Condición: New. Paperback. Pub Date: 2020-08-01 Pages: 174 Language: Chinese Publisher: People's Posts and Telecommunications Publishing House C Trap and Defects The author based on a paper he published in Bell Labs in 1985. combined with his own work Experience expands this paper into a classic work of precious value to C programmers.?The starting point of this book is not to criticize the C language. but to help C programmers bypass the traps and obstacles in the programming process.?C Traps and Defects is.