9787111187066 - 数字集成电路与嵌入式内核系统的测试设计 (1 resultados)
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Librería: liu xing, Nanjing, JS, Chinaliu xing
Contactar con el vendedorVendedor de 5 estrellasCondición: Nuevo
EUR 64,15
Envío por EUR 15,61Se envía de China a Estados Unidos de AmericaCantidad disponible: 1 disponibles
paperback. Condición: New. Paperback. Pub Date: 2006 05 of Pages: 284 in Publisher: Machinery Industry Press. digital integrated circuits with embedded kernel system test design (with CD) discusses the integrated circuit with embedded digital systems testing technology. and put forward many important and key solutions. Practical… problems encountered in testing embedded cores and SoC test problems are discussed from the investment cost of the technology and products. Digital integrated circuits and embedded kernel syste.
