Isbn: 9787030515766 - 纳米力学测试新方法－扫描探针声学显微术 (1 resultados)
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Librería: liu xing, Nanjing, JS, Chinaliu xing
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EUR 97,53
Envío por EUR 16,00Se envía de China a Estados Unidos de AmericaCantidad disponible: 3 disponibles
paperback. Condición: New. Paperback. Pub Date: 2017-03-01 Pages: $number Language: Chinese Publisher: Science Press This book. starting from the Mechanics Foundation-Contact mechanics of afam. this paper expounds the principle and foundation of AFAM. accuracy and sensitivity. viscoelastic imaging . as well as the wide application of AFAM. In addition. the rising frequency of atomic force microscopy has been carried out. …
