ISBN: 9784817196859 - 半導体デバイスの不良・故障解析技術 (信頼性技術叢書) (1 resultados)

Condición: New. This essential volume, part of the Reliability Technology Series, delves into the critical methodologies and techniques for analyzing defects and failures in semiconductor devices. Published by Nikka Giren Publishing, it offers in-depth insights for professionals and researchers in electronics, manufacturing, and quality control seeking to enhance device reliability and performance. The book covers various analytical approaches, providing a comprehensive resource for understanding and resolving common and complex issues in semiconductor technology. Note: The text is entirely in Japanese. Brand New Japanese Edition. Ships worldwide from Japan via Japan Post. Expedited shipping via FedEx available.…