9784431568049 - electron nano-imaging: basics of imaging and diffraction for tem and stem de tanaka, nobuo (6 resultados)
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Librería: Books Puddle, New York, NY, Estados Unidos de AmericaBooks Puddle
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EUR 135,00
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Condición: New. Softcover reprint of the original 1st ed. 2017 edition NO-PA16APR2015-KAP.
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Librería: AHA-BUCH GmbH, Einbeck, AlemaniaAHA-BUCH GmbH
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EUR 96,29
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Taschenbuch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - In this book, the bases of imaging and diffraction in transmission electron microscopy (TEM) and scanning transmission electron microscopy (STEM) are explained in the style of a textbook. The book focuses on the explanation of electron microscopic…imaging of TEM and STEM without including in the main text distracting information on basic knowledge of crystal diffraction, wave optics, electron lens, and scattering and diffraction theories, which are explained separately in the appendices. A comprehensive explanation is provided on the basis of Fourier transform theory, and this approach is unique in comparison with other advanced resources on high-resolution electron microscopy. With the present textbook, readers are led to understand the essence of the imaging theories of TEM and STEM without being diverted by other knowledge of electron microscopy. The up-to-date information in this book, particularly on imaging details of STEM and aberration corrections, is valuable worldwide fortoday's graduate students and professionals just starting their careers.
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Librería: Revaluation Books, Exeter, Reino UnidoRevaluation Books
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EUR 176,30
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Paperback. Condición: Brand New. reprint edition. 333 pages. 9.25x6.10x0.82 inches. In Stock.
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Librería: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, AlemaniaBuchWeltWeit Ludwig Meier e.K.
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EUR 96,29
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Taschenbuch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -In this book, the bases of imaging and diffraction in transmission electron microscopy (TEM) and scanning transmission electron microscopy (STEM) are explained in the style of a textbook. The book focuses on the explanation of elect…ron microscopic imaging of TEM and STEM without including in the main text distracting information on basic knowledge of crystal diffraction, wave optics, electron lens, and scattering and diffraction theories, which are explained separately in the appendices. A comprehensive explanation is provided on the basis of Fourier transform theory, and this approach is unique in comparison with other advanced resources on high-resolution electron microscopy. With the present textbook, readers are led to understand the essence of the imaging theories of TEM and STEM without being diverted by other knowledge of electron microscopy. The up-to-date information in this book, particularly on imaging details of STEM and aberration corrections, is valuable worldwide for today's graduate students and professionals just starting their careers. 364 pp. Englisch.
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Librería: Majestic Books, Hounslow, Reino UnidoMajestic Books
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EUR 138,95
Envío por EUR 7,60Se envía de Reino Unido a Estados Unidos de AmericaCantidad disponible: 4 disponibles
Condición: New. Print on Demand.
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Librería: Biblios, frankfurt am main, HESSE, AlemaniaBiblios
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EUR 142,55
Envío por EUR 9,95Se envía de Alemania a Estados Unidos de AmericaCantidad disponible: 4 disponibles
Condición: New. PRINT ON DEMAND.
