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Publicado por Springer-Verlag 1992-01-01, 1992
ISBN 10: 3642844073 ISBN 13: 9783642844072
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Publicado por Springer Berlin Heidelberg, 2012
ISBN 10: 3642844073 ISBN 13: 9783642844072
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Añadir al carritoTaschenbuch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - Strutural Analysis of Point Defects in Solids introduces theprinciples and techniques of modern electron paramagneticresonance (EPR) spectroscopy essentialfor applications tothe determination of microscopic defectstructures. Investigations of the microscopic and electronicstructure, and also correlations with themagnetic propertiesof solids, require various multiplemagnetic resonance methods, such as ENDOR and opticallydetected EPR or ENDOR. This book discusses experimental,technological and theoretical aspects of these techniquescomprehensively, from a practical viewpoint, with manyillustrative examples taken from semiconductors and othersolids. The nonspecialist is informed about the potential ofthe different methods, while the researcher faced with thetask of determining defect structures isprovided with thenecessary tools, together with much information oncomputer-aided methods of data analysis and the principlesof modern spectrometer design.
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Publicado por Springer, Springer Jan 2012, 2012
ISBN 10: 3642844073 ISBN 13: 9783642844072
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Añadir al carritoTaschenbuch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Strutural Analysis of Point Defects in Solids introduces theprinciples and techniques of modern electron paramagneticresonance (EPR) spectroscopy essentialfor applications tothe determination of microscopic defectstructures. Investigations of the microscopic and electronicstructure, and also correlations with themagnetic propertiesof solids, require various multiplemagnetic resonance methods, such as ENDOR and opticallydetected EPR or ENDOR. This book discusses experimental,technological and theoretical aspects of these techniquescomprehensively, from a practical viewpoint, with manyillustrative examples taken from semiconductors and othersolids. The nonspecialist is informed about the potential ofthe different methods, while the researcher faced with thetask of determining defect structures isprovided with thenecessary tools, together with much information oncomputer-aided methods of data analysis and the principlesof modern spectrometer design. 384 pp. Englisch.
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Publicado por Springer Berlin Heidelberg, 2012
ISBN 10: 3642844073 ISBN 13: 9783642844072
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Añadir al carritoCondición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Strutural Analysis of Point Defects in Solids introduces theprinciples and techniques of modern electron paramagneticresonance (EPR) spectroscopy essentialfor applications tothe determination of microscopic defectstructures. Investigations.
Idioma: Inglés
Publicado por Springer Berlin Heidelberg, Springer Berlin Heidelberg Jan 2012, 2012
ISBN 10: 3642844073 ISBN 13: 9783642844072
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Añadir al carritoTaschenbuch. Condición: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Strutural Analysis of Point Defects in Solids introduces theprinciples and techniques of modern electron paramagneticresonance (EPR) spectroscopy essentialfor applications tothe determination of microscopic defectstructures. Investigations of the microscopic and electronicstructure, and also correlations with themagnetic propertiesof solids, require various multiplemagnetic resonance methods, such as ENDOR and opticallydetected EPR or ENDOR. This book discusses experimentaltechnological and theoretical aspects of these techniquescomprehensively, from a practical viewpoint, with manyillustrative examples taken from semiconductors and othersolids. The nonspecialist is informed about the potential ofthe different methods, while the researcher faced with thetask of determining defect structures isprovided with thenecessary tools, together with much information oncomputer-aided methods of data analysis and the principlesof modern spectrometer design.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 384 pp. Englisch.
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Añadir al carritoTaschenbuch. Condición: Neu. Structural Analysis of Point Defects in Solids | An Introduction to Multiple Magnetic Resonance Spectroscopy | Johann-Martin Spaeth (u. a.) | Taschenbuch | XI | Englisch | 2012 | Springer | EAN 9783642844072 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu Print on Demand.