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Añadir al carritoPaperback. Condición: Brand New. reprint edition. 310 pages. 9.60x6.70x0.80 inches. In Stock.
Idioma: Inglés
Publicado por Springer Berlin Heidelberg, 2011
ISBN 10: 3642813836 ISBN 13: 9783642813832
Librería: moluna, Greven, Alemania
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Idioma: Inglés
Publicado por Springer Berlin Heidelberg, 2011
ISBN 10: 3642813836 ISBN 13: 9783642813832
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Añadir al carritoTaschenbuch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - Towards the end of the 1960s, a number of quite different circumstances combined to launch a period of intense activity in the digital processing of electron micro graphs. First, many years of work on correcting the resolution-limiting aberrations of electron microscope objectives had shown that these optical impediments to very high resolution could indeed be overcome, but only at the cost of immense exper imental difficulty; thanks largely to the theoretical work of K. -J. Hanszen and his colleagues and to the experimental work of F. Thon, the notions of transfer func tions were beginning to supplant or complement the concepts of geometrical optics in electron optical thinking; and finally, large fast computers, capable of manipu lating big image matrices in a reasonable time, were widely accessible. Thus the idea that recorded electron microscope images could be improved in some way or rendered more informative by subsequent computer processing gradually gained ground. At first, most effort was concentrated on three-dimensional reconstruction, particu larly of specimens with natural symmetry that could be exploited, and on linear operations on weakly scattering specimens (Chap. l). In 1973, however, R. W. Gerchberg and W. O. Saxton described an iterative algorithm that in principle yielded the phase and amplitude of the electron wave emerging from a strongly scattering speci men.
Idioma: Inglés
Publicado por Springer Berlin Heidelberg, Springer Berlin Heidelberg Dez 2011, 2011
ISBN 10: 3642813836 ISBN 13: 9783642813832
Librería: buchversandmimpf2000, Emtmannsberg, BAYE, Alemania
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Añadir al carritoTaschenbuch. Condición: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Towards the end of the 1960s, a number of quite different circumstances combined to launch a period of intense activity in the digital processing of electron micro graphs. First, many years of work on correcting the resolution-limiting aberrations of electron microscope objectives had shown that these optical impediments to very high resolution could indeed be overcome, but only at the cost of immense exper imental difficulty; thanks largely to the theoretical work of K. -J. Hanszen and his colleagues and to the experimental work of F. Thon, the notions of transfer func tions were beginning to supplant or complement the concepts of geometrical optics in electron optical thinking; and finally, large fast computers, capable of manipu lating big image matrices in a reasonable time, were widely accessible. Thus the idea that recorded electron microscope images could be improved in some way or rendered more informative by subsequent computer processing gradually gained ground. At first, most effort was concentrated on three-dimensional reconstruction, particu larly of specimens with natural symmetry that could be exploited, and on linear operations on weakly scattering specimens (Chap. l). In 1973, however, R. W. Gerchberg and W. O. Saxton described an iterative algorithm that in principle yielded the phase and amplitude of the electron wave emerging from a strongly scattering speci men.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 316 pp. Englisch.
Idioma: Inglés
Publicado por Springer Berlin Heidelberg Dez 2011, 2011
ISBN 10: 3642813836 ISBN 13: 9783642813832
Librería: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Alemania
EUR 106,99
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Añadir al carritoTaschenbuch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Towards the end of the 1960s, a number of quite different circumstances combined to launch a period of intense activity in the digital processing of electron micro graphs. First, many years of work on correcting the resolution-limiting aberrations of electron microscope objectives had shown that these optical impediments to very high resolution could indeed be overcome, but only at the cost of immense exper imental difficulty; thanks largely to the theoretical work of K. -J. Hanszen and his colleagues and to the experimental work of F. Thon, the notions of transfer func tions were beginning to supplant or complement the concepts of geometrical optics in electron optical thinking; and finally, large fast computers, capable of manipu lating big image matrices in a reasonable time, were widely accessible. Thus the idea that recorded electron microscope images could be improved in some way or rendered more informative by subsequent computer processing gradually gained ground. At first, most effort was concentrated on three-dimensional reconstruction, particu larly of specimens with natural symmetry that could be exploited, and on linear operations on weakly scattering specimens (Chap. l). In 1973, however, R. W. Gerchberg and W. O. Saxton described an iterative algorithm that in principle yielded the phase and amplitude of the electron wave emerging from a strongly scattering speci men. 316 pp. Englisch.