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Publicado por Springer Auflage: 3rd ed. 2008. Corr. 2nd printing 2009, 2008
ISBN 10: 3540738851ISBN 13: 9783540738855
Librería: BUCHSERVICE / ANTIQUARIAT Lars Lutzer, Wahlstedt, Alemania
Libro
Hardcover. Condición: gut. This hugely successful and highly acclaimed text is designed to meet the needs of materials scientists at all levels. In this third edition readers get a fully updated and revised text, too. Fultz and Howe explain concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The edition has been updated to cover important technical developments, including the remarkable recent improvement in resolution of the TEM, and all chapters have been updated and revised for clarity. A new chapter on high resolution STEM methods has been added. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises. In englischer Sprache. 758 pages. 3,3 x 16 x 23,3 cm Auflage: 3rd ed. 2008. Corr. 2nd printing 2009.
Publicado por Springer, 2009
ISBN 10: 3540738851ISBN 13: 9783540738855
Librería: brandnewtexts4sale, Houston, TX, Estados Unidos de America
Libro
Hardcover. Condición: New. 3rd Edition. 100% BRAND NEW US HARDCOVER STUDENT 3rd Edition / shrink wrapped / Mint condition / ISBN-10: 3540738851 / Shipped out in one business day with free tracking.
Publicado por Springer, 2009
ISBN 10: 3540738851ISBN 13: 9783540738855
Librería: dsmbooks, Liverpool, Reino Unido
Libro
Hardcover. Condición: Good. Good. book.