ISBN: 9783540115151 - experimental aspects (vol 2) (point defects in semiconductors) (4 resultados)

Hardcover. Condición: Gut. 295 p., with numerous figures, Good condition. Ex-Library with usual markings. Sprache: Englisch Gewicht in Gramm: 725.

Hardcover. Condición: Gut. XVI, 295 Ex-library with stamp and library-signature. GOOD condition, some traces of use. Ehem. Bibliotheksexemplar mit Signatur und Stempel. GUTER Zustand, ein paar Gebrauchsspuren. C-05849 3540115153 Sprache: Englisch Gewicht in Gramm: 550.

Hardcover. Condición: Very Good. No Jacket. 1st Edition. Published by Springer-verlag Berlin in 1983, here is the first hardback printing of J.Bourgoin and M.Lannoo's Point Defects in Semiconductors II: Experimental Aspects (Stringer Series in Solid-State Sciences #35). Paper covered brown boards, white/orange spine and front cover lettering, 295 illustrated pages the book is in very good condition with the sticker of a previous owner, eminent Physicist Dr A.M.Stoneham applied to the top of the front free end paper and some very light rubbing to the edges of the boards. …

Condición: gut. 1983. Point Defects in Semiconductors II. Experimental Aspects. Springer Series in Solid-State Sciences; Vol. 35. In deutscher Sprache. pages.