9783527349517 - introduction to spectroscopic ellipsometry of thin film materials: instrumentation, data analysis, and applications de wee, andrew t. s.; yin, xinmao; tang, chi sin (4 resultados)
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Librería: Bookbot, Prague, Republica ChecaBookbot
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EUR 55,49
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Softcover. Condición: Fine. Abnutzung / Risse - leicht; Vergilbt / ausgeblichen. A one-of-a-kind text offering an introduction to the use of spectroscopic ellipsometry for novel material characterization In Introduction to Spectroscopic Ellipsometry of Thin Film Instrumentation, Data Analysis and Applications , a team of eminent… researchers delivers an incisive exploration of how the traditional experimental technique of spectroscopic ellipsometry is used to characterize the intrinsic properties of novel materials. The book focuses on the scientifically and technologically important two-dimensional transition metal dichalcogenides (2D-TMDs), magnetic oxides like manganite materials, and unconventional superconductors, including copper oxide systems. The distinguished authors discuss the characterization of properties, like electronic structures, interfacial properties, and the consequent quasiparticle dynamics in novel quantum materials. Along with illustrative and specific case studies on how spectroscopic ellipsometry is used to study the optical and quasiparticle properties of novel systems, the book Perfect for master's- and PhD-level students in physics and chemistry, Introduction to Spectroscopic Ellipsometry of Thin Film Materials will also earn a place in the libraries of those studying materials science seeking a one-stop reference for the applications of spectroscopic ellipsometry to novel developed materials.
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Librería: moluna, Greven, Alemaniamoluna
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EUR 102,00
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Condición: New. Andrew T. S. Wee is a class of 62 Professor of Physics, and Director of the Surface Science Laboratory at the National University of Singapore (NUS). His research interests are in surface and nanoscale science, scanning tunnelling microscopy (STM) and synch.
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Librería: BUCHSERVICE / ANTIQUARIAT Lars Lutzer, Wahlstedt, AlemaniaBUCHSERVICE / ANTIQUARIAT Lars Lutzer
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EUR 179,95
Envío por EUR 39,95Se envía de Alemania a Estados Unidos de AmericaCantidad disponible: 1 disponibles
Condición: gut. 2022. Introduction to Spectroscopic Ellipsometry of Thin Film Materials: Instrumentation, Data Analysis, and Applications In deutscher Sprache. pages.
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Librería: Ria Christie Collections, Uxbridge, Reino UnidoRia Christie Collections
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EUR 101,56
Envío por EUR 14,04Se envía de Reino Unido a Estados Unidos de AmericaCantidad disponible: Más de 20 disponibles
Condición: New. PRINT ON DEMAND Book; New; Fast Shipping from the UK. No. book.
