9783330049550 - decision patterns on software metrices for single& multiple projects de moparthi, nageswara rao; sagar, p. vidhya; satyanarayana, s. (7 resultados)
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Taschenbuch. Condición: Neu. Decision Patterns on Software Metrices for Single& Multiple Projects | Nageswara Rao Moparthi (u. a.) | Taschenbuch | 200 S. | Englisch | 2017 | LAP LAMBERT Academic Publishing | EAN 9783330049550 | Verantwortliche Person für die EU: preigu GmbH & Co. KG, Lengericher Landstr. 19, 49078 Osnabrück, mai…l[at]preigu[dot]de | Anbieter: preigu.
Decision Patterns on Software Metrices for Single& Multiple Projects
Moparthi, Nageswara Rao/ Sagar, P. Vidhya/ Satyanarayana, S.
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Paperback. Condición: Brand New. 200 pages. 8.66x5.91x0.46 inches. In Stock.
Decision Patterns on Software Metrices for Single& Multiple Projects
Moparthi, Nageswara Rao, Sagar, P. Vidhya, Satyanarayana, S.
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paperback. Condición: New. NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
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Taschenbuch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -In this research book found the Methods for detecting decision patterns on software metrics for single and associated multiple projects while implantation of SDLC Phases for reinforced taking optimal way for decision making which he…lps a lot for client in terms of business process improvement.In our first model, a preprocessed based hybrid Bayesian network was implemented to handle large number of metrics for multi-defect decision patterns and other a new ensemble defect prediction classification model was implemented on multiple associated products to predict metric relationship, along with defects patterns and also establishing a new privacy preserving based defect prediction classification model was implemented on multiple associated products to predict metric relationship, along with defects patterns. 200 pp. Englisch.
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Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Autor/Autorin: Moparthi Nageswara RaoDr.M.Nageswara Rao is Distinguished Professor, Inventor, Author and Business leader Born in India. He Received his M.Tech(CSE) & PhD(Computer Science & Technology) from ANU Univers…ity and SKU University. Dr.M. .
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Taschenbuch. Condición: Neu. This item is printed on demand - Print on Demand Titel. Neuware -In this research book found the Methods for detecting decision patterns on software metrics for single and associated multiple projects while implantation of SDLC Phases for reinforced taking optimal way for decision making which helps…a lot for client in terms of business process improvement.In our first model, a preprocessed based hybrid Bayesian network was implemented to handle large number of metrics for multi-defect decision patterns and other a new ensemble defect prediction classification model was implemented on multiple associated products to predict metric relationship, along with defects patterns and also establishing a new privacy preserving based defect prediction classification model was implemented on multiple associated products to predict metric relationship, along with defects patterns.VDM Verlag, Dudweiler Landstraße 99, 66123 Saarbrücken 200 pp. Englisch.
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Taschenbuch. Condición: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - In this research book found the Methods for detecting decision patterns on software metrics for single and associated multiple projects while implantation of SDLC Phases for reinforced taking optimal way for decision making which helps a… lot for client in terms of business process improvement.In our first model, a preprocessed based hybrid Bayesian network was implemented to handle large number of metrics for multi-defect decision patterns and other a new ensemble defect prediction classification model was implemented on multiple associated products to predict metric relationship, along with defects patterns and also establishing a new privacy preserving based defect prediction classification model was implemented on multiple associated products to predict metric relationship, along with defects patterns.
