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Librería: California Books, Miami, FL, Estados Unidos de America
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Librería: Books Puddle, New York, NY, Estados Unidos de America
EUR 217,12
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Idioma: Inglés
Publicado por Springer International Publishing, Springer Nature Switzerland, 2021
ISBN 10: 3030332624 ISBN 13: 9783030332624
Librería: AHA-BUCH GmbH, Einbeck, Alemania
EUR 171,19
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Añadir al carritoTaschenbuch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - This updated and revised edition of a classic work provides a summary of methods for numerical computation of high resolution conventional and scanning transmission electron microscope images. At the limits of resolution, image artifacts due to the instrument and the specimen interaction can complicate image interpretation. Image calculations can help the user to interpret and understand high resolution information in recorded electron micrographs. The book contains expanded sections on aberration correction, including a detailed discussion of higher order (multipole) aberrations and their effect on high resolution imaging, new imaging modes such as ABF (annular bright field), and the latest developments in parallel processing using GPUs (graphic processing units), as well as updated references. Beginning and experienced users at the advanced undergraduate or graduate level will find the book to be a unique and essential guide to the theory and methods of computation in electron microscopy.
Idioma: Inglés
Publicado por Springer International Publishing, Springer Nature Switzerland Mär 2021, 2021
ISBN 10: 3030332624 ISBN 13: 9783030332624
Librería: buchversandmimpf2000, Emtmannsberg, BAYE, Alemania
EUR 171,19
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Añadir al carritoTaschenbuch. Condición: Neu. Neuware -This updated and revised edition of a classic work provides a summary of methods for numerical computation of high resolution conventional and scanning transmission electron microscope images. At the limits of resolution, image artifacts due to the instrument and the specimen interaction can complicate image interpretation. Image calculations can help the user to interpret and understand high resolution information in recorded electron micrographs. The book contains expanded sections on aberration correction, including a detailed discussion of higher order (multipole) aberrations and their effect on high resolution imaging, new imaging modes such as ABF (annular bright field), and the latest developments in parallel processing using GPUs (graphic processing units), as well as updated references. Beginning and experienced users at the advanced undergraduate or graduate level will find the book to be a unique and essential guide to the theory and methods of computation in electron microscopy.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 368 pp. Englisch.
EUR 244,22
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Añadir al carritoPaperback. Condición: Brand New. 3rd edition. 368 pages. 9.25x6.10x0.79 inches. In Stock.
EUR 239,14
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Añadir al carritoPaperback. Condición: New. NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
Idioma: Inglés
Publicado por Springer International Publishing, Springer Nature Switzerland Mär 2021, 2021
ISBN 10: 3030332624 ISBN 13: 9783030332624
Librería: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Alemania
EUR 171,19
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Añadir al carritoTaschenbuch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This updated and revised edition of a classic work provides a summary of methods for numerical computation of high resolution conventional and scanning transmission electron microscope images. At the limits of resolution, image artifacts due to the instrument and the specimen interaction can complicate image interpretation. Image calculations can help the user to interpret and understand high resolution information in recorded electron micrographs. The book contains expanded sections on aberration correction, including a detailed discussion of higher order (multipole) aberrations and their effect on high resolution imaging, new imaging modes such as ABF (annular bright field), and the latest developments in parallel processing using GPUs (graphic processing units), as well as updated references. Beginning and experienced users at the advanced undergraduate or graduate level will find the book to be a unique and essential guide to the theory and methods of computation in electron microscopy. 368 pp. Englisch.
Idioma: Inglés
Publicado por Springer International Publishing, 2021
ISBN 10: 3030332624 ISBN 13: 9783030332624
Librería: moluna, Greven, Alemania
EUR 146,12
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Añadir al carritoCondición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Features in-depth coverage of numerical computation of electron microscopy images including multislice methodsCovers high resolution CTEM and STEM image interpretation Addresses the latest developments in the field from the last decade.
Librería: preigu, Osnabrück, Alemania
EUR 150,30
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Añadir al carritoTaschenbuch. Condición: Neu. Advanced Computing in Electron Microscopy | Earl J. Kirkland | Taschenbuch | xii | Englisch | 2021 | Springer | EAN 9783030332624 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu Print on Demand.
Librería: Majestic Books, Hounslow, Reino Unido
EUR 222,01
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Añadir al carritoCondición: New. Print on Demand.
Librería: Biblios, Frankfurt am main, HESSE, Alemania
EUR 227,60
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Añadir al carritoCondición: New. PRINT ON DEMAND.