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Añadir al carritoCondición: New. pp. 192.
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Librería: Biblios, Frankfurt am main, HESSE, Alemania
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Idioma: Inglés
Publicado por Springer London Ltd, England, 2005
ISBN 10: 1852338997 ISBN 13: 9781852338992
Librería: Grand Eagle Retail, Bensenville, IL, Estados Unidos de America
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Añadir al carritoHardcover. Condición: new. Hardcover. New manufacturing technologies have made possible the integration of entire systems on a single chip. This new design paradigm, termed system-on-chip (SOC), together with its associated manufacturing problems, represents a real challenge for designers.SOC is also reshaping approaches to test and validation activities. These are beginning to migrate from the traditional register-transfer or gate levels of abstraction to the system level. Until now, test and validation have not been supported by system-level design tools so designers have lacked the infrastructure to exploit all the benefits stemming from the adoption of the system level of abstraction. Research efforts are already addressing this issue.This monograph provides a state-of-the-art overview of the current validation and test techniques by covering all aspects of the subject including:modeling of bugs and defects;stimulus generation for validation and test purposes (including timing errors;design for testability. New manufacturing technologies have made possible the integration of entire systems on a single chip. This monograph provides an overview of the validation and test techniques by covering various aspects of the subject including: modeling of bugs and defects; stimulus generation for validation and test purposes; and design for testability. Shipping may be from multiple locations in the US or from the UK, depending on stock availability.
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Añadir al carritoCondición: Sehr gut. Zustand: Sehr gut | Sprache: Englisch | Produktart: Bücher | New manufacturing technologies have made possible the integration of entire systems on a single chip. This new design paradigm, termed system-on-chip (SOC), together with its associated manufacturing problems, represents a real challenge for designers.As well as giving rise to new design practices, SOC is also reshaping approaches to test and validation activities. These are beginning to migrate from the traditional register-transfer or gate levels of abstraction to the system level. Until now, test and validation have not been supported by system-level design tools so designers have lacked the necessary infrastructure to exploit all the benefits stemming from the adoption of the system level of abstraction such as higher functional performance and greater operating speed. Research efforts are already addressing this issue.System-level Test and Validation of Hardware/Software Systems provides a state-of-the-art overview of the current validation and test techniques by covering all aspects of the subject including:¿ modeling of bugs and defects;¿ stimulus generation for validation and test purposes (including timing errors;¿ design for testability.For researchers working on system-level validation and testing, for tool vendors involved in developing hardware-software co-design tools and for graduate students working in embedded systems and SOC design and implementation, System-level Test and Validation of Hardware/Software Systems will be an invaluable source of reference.
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Añadir al carritoGebunden. Condición: New. The reader will learn about the state of the art in system-level validation and test procedures which will enhance both the reliability and performance of system on chip designsMatteo Sonza Reorda is the leader of the computer-aided design gro.
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Librería: Mispah books, Redhill, SURRE, Reino Unido
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Idioma: Inglés
Publicado por Springer London Mai 2005, 2005
ISBN 10: 1852338997 ISBN 13: 9781852338992
Librería: AHA-BUCH GmbH, Einbeck, Alemania
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Añadir al carritoBuch. Condición: Neu. Neuware - New manufacturing technologies have made possible the integration of entire systems on a single chip. This new design paradigm, termed system-on-chip (SOC), together with its associated manufacturing problems, represents a real challenge for designers.SOC is also reshaping approaches to test and validation activities. These are beginning to migrate from the traditional register-transfer or gate levels of abstraction to the system level. Until now, test and validation have not been supported by system-level design tools so designers have lacked the infrastructure to exploit all the benefits stemming from the adoption of the system level of abstraction. Research efforts are already addressing this issue.This monograph provides a state-of-the-art overview of the current validation and test techniques by covering all aspects of the subject including:modeling of bugs and defects;stimulus generation for validation and test purposes (including timing errors;design for testability.
Librería: GreatBookPrices, Columbia, MD, Estados Unidos de America
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Añadir al carritoCondición: As New. Unread book in perfect condition.
Idioma: Inglés
Publicado por Springer London Ltd, England, 2005
ISBN 10: 1852338997 ISBN 13: 9781852338992
Librería: AussieBookSeller, Truganina, VIC, Australia
EUR 211,09
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Añadir al carritoHardcover. Condición: new. Hardcover. New manufacturing technologies have made possible the integration of entire systems on a single chip. This new design paradigm, termed system-on-chip (SOC), together with its associated manufacturing problems, represents a real challenge for designers.SOC is also reshaping approaches to test and validation activities. These are beginning to migrate from the traditional register-transfer or gate levels of abstraction to the system level. Until now, test and validation have not been supported by system-level design tools so designers have lacked the infrastructure to exploit all the benefits stemming from the adoption of the system level of abstraction. Research efforts are already addressing this issue.This monograph provides a state-of-the-art overview of the current validation and test techniques by covering all aspects of the subject including:modeling of bugs and defects;stimulus generation for validation and test purposes (including timing errors;design for testability. New manufacturing technologies have made possible the integration of entire systems on a single chip. This monograph provides an overview of the validation and test techniques by covering various aspects of the subject including: modeling of bugs and defects; stimulus generation for validation and test purposes; and design for testability. Shipping may be from our Sydney, NSW warehouse or from our UK or US warehouse, depending on stock availability.