9781528508155 - Carrier Lifetime Measurement by the Photoconductive Decay Method (Classic Reprint) de Mattis, Richard L. (3 resultados)

PAP. Condición: New. New Book. Shipped from UK. Established seller since 2000.

PAP. Condición: New. New Book. Shipped from UK. Established seller since 2000.

Paperback. Condición: New. Print on Demand. This book delves into the measurement of carrier lifetime in semiconductor materials, focusing on the photoconductive decay (PCD) method. The PCD method is commonly used to determine the time it takes for excess carriers, generated by light, to recombine. The author provides a detailed analysis of the limitations and potential errors associated with this technique. In addition, the author explores the effects of various experimental parameters, such as excess carrier density, light source type, sample inhomogeneity, filter thickness, and temperature, on the PCD measurement. The book also discusses other considerations, including light turn-off time, series resistance, specimen current, and specimen end contacts. The author offers insights into the phenomenon of carrier trapping, and discusses how to identify and avoid its influence on PCD measurements. The book concludes by emphasizing the importance of understanding the limitations and nuances of the PCD method to obtain accurate and meaningful measurements of carrier lifetime. This book is a reproduction of an important historical work, digitally reconstructed using state-of-the-art technology to preserve the original format. In rare cases, an imperfection in the original, such as a blemish or missing page, may be replicated in the book. print-on-demand item.