Isbn: 9781527767133 - ellipsometry in the measurement of surfaces and thin films (classic reprint): symposium proceedings, washington 1963; symposium held september 5-6, ... standards, washington, d. c (classic reprint) (3 resultados)

PAP. Condición: New. New Book. Shipped from UK. Established seller since 2000.

PAP. Condición: New. New Book. Shipped from UK. Established seller since 2000.

Paperback. Condición: New. Print on Demand. This book is a collection of papers presented at a symposium on ellipsometry, a technique that uses the change in polarization of light upon reflection to study the optical properties of surfaces and thin films. The book begins with a historical review of ellipsometry, from its early development to its present-day applications. The following papers discuss the theory of ellipsometry, computational techniques, instrumentation, and applications in various fields such as the study of metal surfaces, oxide films, and organic films. The book provides a comprehensive overview of ellipsometry and its applications, making it a valuable resource for researchers and practitioners in the field of optics and surface science. This book is a reproduction of an important historical work, digitally reconstructed using state-of-the-art technology to preserve the original format. In rare cases, an imperfection in the original, such as a blemish or missing page, may be replicated in the book. print-on-demand item.…