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Publicado por Springer US Nov 2010, 2010
ISBN 10: 1441946748ISBN 13: 9781441946744
Librería: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Alemania
Libro Impresión bajo demanda
Taschenbuch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Scanning electr on microscopy (SEM) and x-ray microanalysis can produce magnified images and in situ chemical information from virtually any type of specimen. The two instruments generally operate in a high vacuum and a very dry environment in order to produce the high energy beam of electrons needed for imaging and analysis. With a few notable exceptions, most specimens destined for study in the SEM are poor conductors and composed of beam sensitive light elements containing variable amounts of water. In the SEM, the imaging system depends on the specimen being sufficiently electrically conductive to ensure that the bulk of the incoming electrons go to ground. The formation of the image depends on collecting the different signals that are scattered as a consequence of the high energy beam interacting with the sample. Backscattered electrons and secondary electrons are generated within the primary beam-sample interactive volume and are the two principal signals used to form images. The backscattered electron coefficient ( ) increases with increasing atomic number of the specimen, whereas the secondary electron coefficient ( ) is relatively insensitive to atomic number. This fundamental diff- ence in the two signals can have an important effect on the way samples may need to be prepared. The analytical system depends on collecting the x-ray photons that are generated within the sample as a consequence of interaction with the same high energy beam of primary electrons used to produce images. 344 pp. Englisch.
Publicado por Springer US, 2010
ISBN 10: 1441946748ISBN 13: 9781441946744
Librería: moluna, Greven, Alemania
Libro Impresión bajo demanda
Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Identifies problems that all specimens present in examining their structure and analysis in the SEMDescribes a series of protocols to ensure that a specimen is properly prepared once the particular problems are identifiedGuides the reader t.
Publicado por Springer, 2010
ISBN 10: 1441946748ISBN 13: 9781441946744
Librería: GF Books, Inc., Hawthorne, CA, Estados Unidos de America
Libro
Condición: Fine. Book is in Used-LikeNew condition. Pages and cover are clean and intact. Used items may not include supplementary materials such as CDs or access codes. May show signs of minor shelf wear.
Publicado por Springer, 2010
ISBN 10: 1441946748ISBN 13: 9781441946744
Librería: GF Books, Inc., Hawthorne, CA, Estados Unidos de America
Libro
Condición: New. Book is in NEW condition.
Publicado por Springer, 2010
ISBN 10: 1441946748ISBN 13: 9781441946744
Librería: Books Puddle, New York, NY, Estados Unidos de America
Libro
Condición: New. pp. XII + 330.
Publicado por Springer US, 2010
ISBN 10: 1441946748ISBN 13: 9781441946744
Librería: AHA-BUCH GmbH, Einbeck, Alemania
Libro
Taschenbuch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - Scanning electr on microscopy (SEM) and x-ray microanalysis can produce magnified images and in situ chemical information from virtually any type of specimen. The two instruments generally operate in a high vacuum and a very dry environment in order to produce the high energy beam of electrons needed for imaging and analysis. With a few notable exceptions, most specimens destined for study in the SEM are poor conductors and composed of beam sensitive light elements containing variable amounts of water. In the SEM, the imaging system depends on the specimen being sufficiently electrically conductive to ensure that the bulk of the incoming electrons go to ground. The formation of the image depends on collecting the different signals that are scattered as a consequence of the high energy beam interacting with the sample. Backscattered electrons and secondary electrons are generated within the primary beam-sample interactive volume and are the two principal signals used to form images. The backscattered electron coefficient ( ) increases with increasing atomic number of the specimen, whereas the secondary electron coefficient ( ) is relatively insensitive to atomic number. This fundamental diff- ence in the two signals can have an important effect on the way samples may need to be prepared. The analytical system depends on collecting the x-ray photons that are generated within the sample as a consequence of interaction with the same high energy beam of primary electrons used to produce images.
Publicado por Springer, 2010
ISBN 10: 1441946748ISBN 13: 9781441946744
Librería: Books Unplugged, Amherst, NY, Estados Unidos de America
Libro
Condición: Fair. Buy with confidence! Book is in acceptable condition with wear to the pages, binding, and some marks within.
Publicado por Springer, 2010
ISBN 10: 1441946748ISBN 13: 9781441946744
Librería: Books Unplugged, Amherst, NY, Estados Unidos de America
Libro
Condición: Good. Buy with confidence! Book is in good condition with minor wear to the pages, binding, and minor marks within.
Publicado por Springer, 2010
ISBN 10: 1441946748ISBN 13: 9781441946744
Librería: GF Books, Inc., Hawthorne, CA, Estados Unidos de America
Libro
Condición: Very Good. Book is in Used-VeryGood condition. Pages and cover are clean and intact. Used items may not include supplementary materials such as CDs or access codes. May show signs of minor shelf wear and contain very limited notes and highlighting.
Publicado por Springer, 2010
ISBN 10: 1441946748ISBN 13: 9781441946744
Librería: Book Deals, Tucson, AZ, Estados Unidos de America
Libro
Condición: New. New! This book is in the same immaculate condition as when it was published.
Publicado por Springer, 2010
ISBN 10: 1441946748ISBN 13: 9781441946744
Librería: Majestic Books, Hounslow, Reino Unido
Libro Impresión bajo demanda
Condición: New. Print on Demand pp. XII + 330 159 Illus. (Col.).
Publicado por Springer, 2010
ISBN 10: 1441946748ISBN 13: 9781441946744
Librería: Revaluation Books, Exeter, Reino Unido
Libro
Paperback. Condición: Brand New. 342 pages. 9.90x6.90x0.90 inches. In Stock.