9781107036413 - Modern RF and Microwave Measurement Techniques Hardback (The Cambridge RF and Microwave Engineering Series) de Teppati; Ferrero; Sayed (22 resultados)

Condición: New.

Condición: New.

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Condición: As New. Unread book in perfect condition.

Condición: New.

Condición: As New. Unread book in perfect condition.

Hardback. Condición: New. This comprehensive, hands-on review of the most up-to-date techniques in RF and microwave measurement combines microwave circuit theory and metrology, in-depth analysis of advanced modern instrumentation, methods and systems, and practical advice for professional RF and microwave engineers and researchers. Topics covered include microwave instrumentation, such as network analyzers, real-time spectrum analyzers and microwave synthesizers; linear measurements, such as VNA calibrations, noise figure measurements, time domain reflectometry and multiport measurements; and non-linear measurements, such as load- and source-pull techniques, broadband signal measurements, and non-linear NVAs. Each technique is discussed in detail and accompanied by state-of-the-art solutions to the unique technical challenges associated with its use. With each chapter written by internationally recognised experts in the field, this is an invaluable resource for researchers and professionals involved with microwave measurements.

Condición: New. pp. 504.

Hardcover. Condición: Brand New. 1st edition. 504 pages. 10.00x7.25x1.25 inches. In Stock.

Hardback. Condición: New. This comprehensive, hands-on review of the most up-to-date techniques in RF and microwave measurement combines microwave circuit theory and metrology, in-depth analysis of advanced modern instrumentation, methods and systems, and practical advice for professional RF and microwave engineers and researchers. Topics covered include microwave instrumentation, such as network analyzers, real-time spectrum analyzers and microwave synthesizers; linear measurements, such as VNA calibrations, noise figure measurements, time domain reflectometry and multiport measurements; and non-linear measurements, such as load- and source-pull techniques, broadband signal measurements, and non-linear NVAs. Each technique is discussed in detail and accompanied by state-of-the-art solutions to the unique technical challenges associated with its use. With each chapter written by internationally recognised experts in the field, this is an invaluable resource for researchers and professionals involved with microwave measurements.

Buch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - This comprehensive, hands-on review of the most up-to-date techniques in RF and microwave measurement combines microwave circuit theory and metrology, in-depth analysis of advanced modern instrumentation, methods and systems, and practical advice for professional RF and microwave engineers and researchers. Topics covered include microwave instrumentation, such as network analyzers, real-time spectrum analyzers and microwave synthesizers; linear measurements, such as VNA calibrations, noise figure measurements, time domain reflectometry and multiport measurements; and non-linear measurements, such as load- and source-pull techniques, broadband signal measurements, and non-linear NVAs. Each technique is discussed in detail and accompanied by state-of-the-art solutions to the unique technical challenges associated with its use. With each chapter written by internationally recognised experts in the field, this is an invaluable resource for researchers and professionals involved with microwave measurements.

Condición: New. 2013. 1st Edition. Hardcover. A comprehensive, hands-on review of the most up-to-date techniques in RF and microwave measurement, including practical advice on deployment challenges. Editor(s): Teppati, Valeria; Ferrero, Andrea; Sayed, Mohamed. Series: The Cambridge RF and Microwave Engineering Series. Num Pages: 471 pages, 340 b/w illus. 10 tables. BIC Classification: TJFN. Category: (UU) Undergraduate. Dimension: 182 x 248 x 31. Weight in Grams: 1122. . . . . . Books ship from the US and Ireland.

Condición: New. 2013. 1st Edition. Hardcover. A comprehensive, hands-on review of the most up-to-date techniques in RF and microwave measurement, including practical advice on deployment challenges. Editor(s): Teppati, Valeria; Ferrero, Andrea; Sayed, Mohamed. Series: The Cambridge RF and Microwave Engineering Series. Num Pages: 471 pages, 340 b/w illus. 10 tables. BIC Classification: TJFN. Category: (UU) Undergraduate. Dimension: 182 x 248 x 31. Weight in Grams: 1122. . . . . .

Hardcover. Condición: new. Hardcover. This comprehensive, hands-on review of the most up-to-date techniques in RF and microwave measurement combines microwave circuit theory and metrology, in-depth analysis of advanced modern instrumentation, methods and systems, and practical advice for professional RF and microwave engineers and researchers. Topics covered include microwave instrumentation, such as network analyzers, real-time spectrum analyzers and microwave synthesizers; linear measurements, such as VNA calibrations, noise figure measurements, time domain reflectometry and multiport measurements; and non-linear measurements, such as load- and source-pull techniques, broadband signal measurements, and non-linear NVAs. Each technique is discussed in detail and accompanied by state-of-the-art solutions to the unique technical challenges associated with its use. With each chapter written by internationally recognised experts in the field, this is an invaluable resource for researchers and professionals involved with microwave measurements. This comprehensive, hands-on review of the most up-to-date techniques in RF and microwave measurement combines fundamental theory with in-depth analysis of advanced modern instrumentation, methods and systems, alongside practical advice for RF and microwave engineers and researchers. This item is printed on demand. Shipping may be from multiple locations in the US or from the UK, depending on stock availability.

Hardcover. Condición: Brand New. 1st edition. 504 pages. 10.00x7.25x1.25 inches. In Stock. This item is printed on demand.

Hardback. Condición: New. This item is printed on demand. New copy - Usually dispatched within 5-9 working days.

Hardcover. Condición: new. Hardcover. This comprehensive, hands-on review of the most up-to-date techniques in RF and microwave measurement combines microwave circuit theory and metrology, in-depth analysis of advanced modern instrumentation, methods and systems, and practical advice for professional RF and microwave engineers and researchers. Topics covered include microwave instrumentation, such as network analyzers, real-time spectrum analyzers and microwave synthesizers; linear measurements, such as VNA calibrations, noise figure measurements, time domain reflectometry and multiport measurements; and non-linear measurements, such as load- and source-pull techniques, broadband signal measurements, and non-linear NVAs. Each technique is discussed in detail and accompanied by state-of-the-art solutions to the unique technical challenges associated with its use. With each chapter written by internationally recognised experts in the field, this is an invaluable resource for researchers and professionals involved with microwave measurements. This comprehensive, hands-on review of the most up-to-date techniques in RF and microwave measurement combines fundamental theory with in-depth analysis of advanced modern instrumentation, methods and systems, alongside practical advice for RF and microwave engineers and researchers. This item is printed on demand. Shipping may be from our UK warehouse or from our Australian or US warehouses, depending on stock availability.

Gebunden. Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. This comprehensive, hands-on review of the most up-to-date techniques in RF and microwave measurement combines fundamental theory with in-depth analysis of advanced modern instrumentation, methods and systems, alongside practical advice for RF and microwave.

Condición: New. Print on Demand pp. 504 304 Illus.

Condición: New. PRINT ON DEMAND pp. 504.

Buch. Condición: Neu. Modern RF and Microwave Measurement Techniques | Valeria Teppati (u. a.) | Buch | Gebunden | Englisch | 2018 | Cambridge University Press | EAN 9781107036413 | Verantwortliche Person für die EU: Libri GmbH, Europaallee 1, 36244 Bad Hersfeld, gpsr[at]libri[dot]de | Anbieter: preigu Print on Demand.

Hardcover. Condición: new. Hardcover. This comprehensive, hands-on review of the most up-to-date techniques in RF and microwave measurement combines microwave circuit theory and metrology, in-depth analysis of advanced modern instrumentation, methods and systems, and practical advice for professional RF and microwave engineers and researchers. Topics covered include microwave instrumentation, such as network analyzers, real-time spectrum analyzers and microwave synthesizers; linear measurements, such as VNA calibrations, noise figure measurements, time domain reflectometry and multiport measurements; and non-linear measurements, such as load- and source-pull techniques, broadband signal measurements, and non-linear NVAs. Each technique is discussed in detail and accompanied by state-of-the-art solutions to the unique technical challenges associated with its use. With each chapter written by internationally recognised experts in the field, this is an invaluable resource for researchers and professionals involved with microwave measurements. This comprehensive, hands-on review of the most up-to-date techniques in RF and microwave measurement combines fundamental theory with in-depth analysis of advanced modern instrumentation, methods and systems, alongside practical advice for RF and microwave engineers and researchers. This item is printed on demand. Shipping may be from our Sydney, NSW warehouse or from our UK or US warehouse, depending on stock availability.