Isbn: 9780266782988 - methods of measurement for semiconductor materials, process control, and divices: quarterly report, january 1 to march 31, 1970 (classic reprint) (3 resultados)

PAP. Condición: New. New Book. Shipped from UK. Established seller since 2000.

PAP. Condición: New. New Book. Shipped from UK. Established seller since 2000.

Paperback. Condición: New. Print on Demand. This book explores the history, present day methods, and future direction of measuring semiconductor materials, process control, and devices. It elucidates the underlying principles of measuring techniques used in the semiconductor industry, providing insight into their strengths and weaknesses. The author examines the evolution of these techniques, tracing the development of new approaches and standards. This book explores the latest research related to specific measurement methods, offering timely insights into the direction of the field. It is an essential read for those seeking a comprehensive understanding of semiconductor measurement techniques and their role in the advancement of the industry. This book is a reproduction of an important historical work, digitally reconstructed using state-of-the-art technology to preserve the original format. In rare cases, an imperfection in the original, such as a blemish or missing page, may be replicated in the book. print-on-demand item.…