Librería: ThriftBooks-Dallas, Dallas, TX, Estados Unidos de America
EUR 26,93
Cantidad disponible: 1 disponibles
Añadir al carritoHardcover. Condición: Good. No Jacket. Missing dust jacket; Pages can have notes/highlighting. Spine may show signs of wear. ~ ThriftBooks: Read More, Spend Less.
Idioma: Inglés
Publicado por MIT Press (2000), Cambridge, Massachusetts, 2000
ISBN 10: 0262232081 ISBN 13: 9780262232081
Librería: Renaissance Books, ANZAAB / ILAB, Dunedin, Nueva Zelanda
Original o primera edición
EUR 28,33
Cantidad disponible: 1 disponibles
Añadir al carritoHardcover. Condición: Near Fine. Estado de la sobrecubierta: No Dust Jacket. First Edition. Price sticker on front free endpaper. No signatures.; Volume Two only. ix, [3], 415 pages. Hardcover. Green cloth boards with silver lettering on spine. Page dimensions: 226 x 149mm. "Dreyfus has helped to create a culture of reflectionof questioning the deep premises that inform and shape work in artificial intelligence and cognitive science. He has also been the primary introducer and interpreter of Martin Heidegger's work to the world of information technology. The essays in this volume represent the fruitful application of deep philosophical analysis to the concerns of our modern technological world.The sections are Coping and Intentionality; Computers and Cognitive Science; and "Applied Heidegger." In addition to cognitive science and artificial intelligence, topics include everyday skills, religion, business practices, and medical care. The book concludes with Dreyfus's responses to the essays."Contributors:Daniel Andler, Patricia Benner, Albert Borgmann, Harry Collins, George Downing, Fernando Flores, Sean Kelly, Joseph Rouse, Theodore R. Schatzki, John Searle, Robert C. Solomon, Charles Spinosa, David Stern, Charles Taylor, Terry Winograd, Mark Wrathall. ; 8vo.
Librería: Mispah books, Redhill, SURRE, Reino Unido
EUR 120,34
Cantidad disponible: 1 disponibles
Añadir al carritohardcover. Condición: Good. Good. Dust Jacket NOT present. CD WILL BE MISSING. . SHIPS FROM MULTIPLE LOCATIONS. book.