ISBN: 9780137723775 - reliability and life testing handbook, volume i: 1 (3 resultados)

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  • Idioma: Inglés

    Editorial: Pearson Education (US), 1993

    0137723776 / 9780137723775

    • Tapa dura

    Librería: World of Books (was SecondSale), Montgomery, IL, Estados Unidos de AmericaWorld of Books (was SecondSale)

    Vendedor de 5 estrellas
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    Condición: Usado - Aceptable

    EUR 31,12

     Gastos de envío gratis 
    Se envía dentro de Estados Unidos de America

    Cantidad disponible: 1 disponible

    Hardback. Condición: Good. This book presents information, procedures, tests and illustrations to help engineers analyze time-to-failure data to ensure greater reliability in the products they design. It offers essential information on a variety of distributions including Chi-square, Exponential, Normal, Lognormal, Weibull, Gamma and others. A reference for reliability, product assurance and test engineers, the guide also provides a step-by-step method for goodness-of-fit analysis, sudden death testing and other techniques. This is the first in a two-volume series. …

  • Idioma: Inglés

    Editorial: Prentice Hall, 1992

    0137723776 / 9780137723775

    • Tapa dura

    Librería: HPB-Red, Dallas, TX, Estados Unidos de AmericaHPB-Red

    Vendedor de 5 estrellas
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    Condición: Usado - Aceptable

    EUR 27,67

    Envío por EUR 3,36 
    Se envía dentro de Estados Unidos de America

    Cantidad disponible: 1 disponible

    Hardcover. Condición: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority.

  • Idioma: Inglés

    Editorial: Pearson Education (US), 1993

    0137723776 / 9780137723775

    • Tapa dura

    Librería: World of Books Inc, Montgomery, IL, Estados Unidos de AmericaWorld of Books Inc

    Vendedor de 4 estrellas
    Contactar con el vendedor

    Condición: Usado - Aceptable

    EUR 32,97

     Gastos de envío gratis 
    Se envía dentro de Estados Unidos de America

    Cantidad disponible: 1 disponible

    Hardback. Condición: Good. This book presents information, procedures, tests and illustrations to help engineers analyze time-to-failure data to ensure greater reliability in the products they design. It offers essential information on a variety of distributions including Chi-square, Exponential, Normal, Lognormal, Weibull, Gamma and others. A reference for reliability, product assurance and test engineers, the guide also provides a step-by-step method for goodness-of-fit analysis, sudden death testing and other techniques. This is the first in a two-volume series. …