ISBN: 9780137723775 - reliability and life testing handbook, volume i: 1 (3 resultados)

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Librería: World of Books (was SecondSale), Montgomery, IL, Estados Unidos de AmericaWorld of Books (was SecondSale)
Contactar con el vendedorVendedor de 5 estrellasCondición: Usado - Aceptable
EUR 31,12
Gastos de envío gratisSe envía dentro de Estados Unidos de AmericaCantidad disponible: 1 disponible
Hardback. Condición: Good. This book presents information, procedures, tests and illustrations to help engineers analyze time-to-failure data to ensure greater reliability in the products they design. It offers essential information on a variety of distributions including Chi-square, Exponential, Normal, Lognormal, Weibull, Gamma and others. A reference for reliability, product assurance and test engineers, the guide also provides a step-by-step method for goodness-of-fit analysis, sudden death testing and other techniques. This is the first in a two-volume series. …

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Librería: HPB-Red, Dallas, TX, Estados Unidos de AmericaHPB-Red
Contactar con el vendedorVendedor de 5 estrellasCondición: Usado - Aceptable
EUR 27,67
Envío por EUR 3,36Se envía dentro de Estados Unidos de AmericaCantidad disponible: 1 disponible
Hardcover. Condición: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority.

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Librería: World of Books Inc, Montgomery, IL, Estados Unidos de AmericaWorld of Books Inc
Contactar con el vendedorVendedor de 4 estrellasCondición: Usado - Aceptable
EUR 32,97
Gastos de envío gratisSe envía dentro de Estados Unidos de AmericaCantidad disponible: 1 disponible
Hardback. Condición: Good. This book presents information, procedures, tests and illustrations to help engineers analyze time-to-failure data to ensure greater reliability in the products they design. It offers essential information on a variety of distributions including Chi-square, Exponential, Normal, Lognormal, Weibull, Gamma and others. A reference for reliability, product assurance and test engineers, the guide also provides a step-by-step method for goodness-of-fit analysis, sudden death testing and other techniques. This is the first in a two-volume series. …