ISBN: 9780130848277 - design-for-test for digital ic's and embedded core systems (9 resultados)

Paperback. Condición: Very Good. It's a well-cared-for item that has seen limited use. The item may show minor signs of wear. All the text is legible, with all pages included. It may have slight markings and/or highlighting.

Paperback. Condición: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority.

Hardcover. Condición: Fair. No Jacket. Readable copy. Pages may have considerable notes/highlighting. ~ ThriftBooks: Read More, Spend Less.

Condición: Good. The book may have minor cosmetic wear like creased spine, cover, scratches, curled corners, folded pages, minor sunburn, minor water damage, minor bent. The book may have some highlights, notes, underlined pages. Accessories such as CD, codes, toys, may not be included . Safe and Secure Mailer. No Hassle Return.…

Paperback. Condición: Acceptable. Connecting readers with great books since 1972. Used textbooks may not include companion materials such as access codes, etc. May have condition issues including wear and notes/highlighting. We ship orders daily and Customer Service is our top priority.

Condición: Good. Former library copy. Pages intact with minimal writing/highlighting. The binding may be loose and creased. Dust jackets/supplements are not included. Includes library markings. Stock photo provided. Product includes identifying sticker. Better World Books: Buy Books. Do Good.

paperback. Condición: Good. Ex-library book with typical stickers and stampings. Priority Mail is available on this item. No international shipping.

Paperback. Condición: new. New Copy. Customer Service Guaranteed.

hardcover. Condición: New. In shrink wrap. Looks like an interesting title.