Pk rastogi (18 resultados)

Filtrar la búsqueda

  • Libros (18)

a

Intervalo de precios personalizado (EUR)

a

  • Idioma: Inglés

    Editorial: Aravali Books International, 1999

    8186880569 / 9788186880562

    • Tapa blanda

    Librería: Biblios, frankfurt am main, HESSE, AlemaniaBiblios

    Vendedor de 4 estrellas
    Contactar con el vendedor

    Condición: Nuevo

    EUR 6,59

    Envío por EUR 9,95 
    Se envía de Alemania a Estados Unidos de America

    Cantidad disponible: 4 disponibles

    Condición: New. pp. 177.

  • Editorial: National Botanical Research Institute

    Librería: Majestic Books, Hounslow, Reino UnidoMajestic Books

    Vendedor de 4 estrellas
    Contactar con el vendedor

    Condición: Nuevo

    EUR 5,13

    Envío por EUR 7,60 
    Se envía de Reino Unido a Estados Unidos de America

    Cantidad disponible: 1 disponibles

    Añadir al carrito

    Condición: New. pp. 18 Illus.

  • Editorial: National Botanical Research Institute

    Librería: Biblios, frankfurt am main, HESSE, AlemaniaBiblios

    Vendedor de 4 estrellas
    Contactar con el vendedor

    Condición: Nuevo

    EUR 6,49

    Envío por EUR 9,95 
    Se envía de Alemania a Estados Unidos de America

    Cantidad disponible: 1 disponibles

    Añadir al carrito

    Condición: New. pp. 18.

  • Idioma: Inglés

    Editorial: Oxford Book Company, 2011

    9350300060 / 9789350300060

    • Tapa dura

    Librería: Biblios, frankfurt am main, HESSE, AlemaniaBiblios

    Vendedor de 4 estrellas
    Contactar con el vendedor

    Condición: Nuevo

    EUR 25,22

    Envío por EUR 9,95 
    Se envía de Alemania a Estados Unidos de America

    Cantidad disponible: 4 disponibles

    Condición: New. pp. vii + 307.

  • Idioma: Inglés

    Editorial: Springer-Verlag, 1994

    0387573542 / 9780387573540

    Serie: Libro 92 de 235 - Springer Series in Optical Sciences

    • Tapa dura

    Librería: G. & J. CHESTERS, TAMWORTH, Reino UnidoG. & J. CHESTERS

    Vendedor de 5 estrellas
    Contactar con el vendedor

    Condición: Usado - Bueno

    EUR 31,48

    Envío por EUR 8,18 
    Se envía de Reino Unido a Estados Unidos de America

    Cantidad disponible: 1 disponibles

    Hardcover. Condición: Very Good. 328 pages, 178 figures, some being in colour, hardback (publisher's cloth), a very good ex-library copy of a book in the Springer Series in Optical Sciences [0387573542].

  • Idioma: Inglés

    Editorial: Elsevier Science 2000-05-15, 2000

    0080430201 / 9780080430201

    • Tapa dura

    Librería: Chiron Media, Wallingford, Reino UnidoChiron Media

    Vendedor de 5 estrellas
    Contactar con el vendedor

    Condición: Nuevo

    EUR 328,77

    Envío por EUR 18,11 
    Se envía de Reino Unido a Estados Unidos de America

    Cantidad disponible: Más de 20 disponibles

    Hardcover. Condición: New.

  • Idioma: Inglés

    Editorial: AMERICAN INSTITUTE OF PHYSICS, 2010

    0735407835 / 9780735407831

    • Tapa blanda
    • Edición internacional

    Librería: UK BOOKS STORE, London, LONDO, Reino UnidoUK BOOKS STORE

    Vendedor de 5 estrellas
    Contactar con el vendedor

    Condición: Nuevo

    EUR 347,69

    Envío por EUR 5,52 
    Se envía de Reino Unido a Estados Unidos de America

    Cantidad disponible: 1 disponibles

    Condición: New. Brand New! Fast Delivery This is an International Edition and ship within 24-48 hours. Deliver by FedEx and Dhl, & Aramex, UPS, & USPS and we do accept APO and PO BOX Addresses. Order can be delivered worldwide within 6-10 days and we do have flat rate for up to 2LB. Extra shipping charges will be requested if the Book weight is more than 5 LB. This Item May be shipped from India, United states & United Kingdom. Depending on your location and availability.

  • Idioma: Inglés

    Editorial: Elsevier Science Ltd, 2000

    0080430201 / 9780080430201

    • Tapa dura

    Librería: Revaluation Books, Exeter, Reino UnidoRevaluation Books

    Vendedor de 5 estrellas
    Contactar con el vendedor

    Condición: Nuevo

    EUR 376,28

    Envío por EUR 17,54 
    Se envía de Reino Unido a Estados Unidos de America

    Cantidad disponible: 2 disponibles

    Hardcover. Condición: Brand New. 633 pages. 9.50x6.75x1.25 inches. In Stock.

  • Idioma: Inglés

    Editorial: Elsevier Science & Technology, Oxford, 2000

    0080430201 / 9780080430201

    • Tapa dura

    Librería: Grand Eagle Retail, Bensenville, IL, Estados Unidos de AmericaGrand Eagle Retail

    Vendedor de 5 estrellas
    Contactar con el vendedor

    Condición: Nuevo

    EUR 549,44

     Gastos de envío gratis 
    Se envía dentro de Estados Unidos de America

    Cantidad disponible: 1 disponibles

    Hardcover. Condición: new. Hardcover. This book covers a wide range of measurement techniques broadly referred to as Optical Metrology, with emphasis on their applications to nondestructive testing. If we look separately at each of the two terms making the generic name Optical Metrology, we find a link to two of the most distinctive aspects of humans: a particularly well developed sense of vision and a desire to classify things using numbers and rules.Of all our five senses, vision is certainly the most developed and the closest to the rational part of our brain. It can be argued that our memory is strongly dependent on images and the brain is particularly good at processing the stimuli received from these images to extract information. Measuring, sizing and counting are, on the other hand, among the fundamental building blocks of modern society. The use of abstract quantities like size, value or intensity has simplified the description of complex enquiry and is the basis of modern science and economy. Hence, it would seem natural that the combination of two such basic aspects should result in the birth of a new field of science. However, it is known that his has not been the case. Optical Metrology remains classified as a group of special techniques used mainly in niche applications. Optical Metrology may be rightly described as an ensemble of techniques in which fields such as physics, electrical and mechanical engineering, and computer science merge and blend in new ways.This book is intended as a tribute to the career of Professor Leopold Pflug. By looking back at his lifelong commitment to the application of optical metrology to the service of engineering sciences, more particularly devoted to the observation of the real behavior of structural components, one can retrace the major revolutions that have taken place in this domain. Starting his activity in 1971 as the head of the Laboratory for Stress Analysis at the EPFL in Switzerland, he first employed photoelasticity as a tool to improve the understanding of the real behavior of complex structures. However he soon recognized the necessity of working with the real materials used to build these structures instead of on replicas made of optically birefringent materials. He then focussed on the use of moire techniques which sparked his fascination with laser-based holography and speckle-based methods. The advent of information technology led him to open up to the use of ESPI and digital image processing techniques. Finally, in the mid 1990s he became interested in the use of optical fibers as a tool for sensing deformations inside structures, not only on their surfaces as in the case of whole-field methods. It is interesting to note the parallel in the evolution of optical metrology vis a vis developments in other fields: the development of lasers led to holographic interferometry, the availability of frame-grabbers led to ESPI and the emergence of fiber optic communications opened the way to the development of fiber optic sensors. This puts in sharp perspective the strong dependence of optical metrology on the latest technology for its development. Also interesting to note is that all fields in optical metrology touched upon by Professor Pflug are still of great relevance, as shown by the contributions in this volume.This book is, however, not intended as a commemoration, rather as an occasion to review the trends and undercurrents that are driving the field of optical metrology, with emphasis on nondestructive testing. All the authors were asked to summarize the recent achievements in their respective fields and to speculate about the future. As a result it has become apparent that it is difficult although not impossible to spot general trends in these disparate fields. Optical metrology has considerably benefited from some of the most important innovations of the recent past: lasers, computers and Shipping may be from multiple locations in the US or from the UK, depending on stock availability.

  • Idioma: Inglés

    Editorial: Elsevier Science, 2000

    0080430201 / 9780080430201

    • Tapa dura

    Librería: moluna, Greven, Alemaniamoluna

    Vendedor de 5 estrellas
    Contactar con el vendedor

    Condición: Nuevo

    EUR 513,35

    Envío por EUR 48,99 
    Se envía de Alemania a Estados Unidos de America

    Cantidad disponible: 1 disponibles

    Gebunden. Condición: New. This book covers a wide range of measurement techniques broadly referred to as Optical Metrology, with emphasis on their applications to nondestructive testing. If we look separately at each of the two terms making the generic name Optical Metrology, we .

  • Idioma: Inglés

    Editorial: John Wiley & Sons, 2000

    0471490520 / 9780471490524

    • Tapa dura

    Librería: moluna, Greven, Alemaniamoluna

    Vendedor de 5 estrellas
    Contactar con el vendedor

    Condición: Nuevo

    EUR 544,99

    Envío por EUR 48,99 
    Se envía de Alemania a Estados Unidos de America

    Cantidad disponible: Más de 20 disponibles

    Condición: New. this book is a welcome addition to the speckle pattern interferometry literature. The book is an excellent value for any graduate student, application engineer, research laboratory and group working in this field. Reading this book is a very enjoyable expe.

  • Idioma: Inglés

    Editorial: Elsevier Science, 2000

    0080430201 / 9780080430201

    • Tapa dura

    Librería: Kennys Bookstore, Olney, MD, Estados Unidos de AmericaKennys Bookstore

    Vendedor de 5 estrellas
    Contactar con el vendedor

    Condición: Nuevo

    EUR 748,68

    Envío por EUR 9,09 
    Se envía dentro de Estados Unidos de America

    Cantidad disponible: 10 disponibles

    Condición: New. 2000. 1st Edition. hardcover. . . . . . Books ship from the US and Ireland.

  • Idioma: Inglés

    Editorial: Elsevier Science, 2000

    0080430201 / 9780080430201

    • Tapa dura
    • Primera edición

    Librería: Kennys Bookshop and Art Galleries Ltd., Galway, GY, IrlandaKennys Bookshop and Art Galleries Ltd.

    Vendedor de 5 estrellas
    Contactar con el vendedor

    Condición: Nuevo

    EUR 603,94

    Envío por EUR 9,50 
    Se envía de Irlanda a Estados Unidos de America

    Cantidad disponible: 10 disponibles

    Condición: New. 2000. 1st Edition. hardcover. . . . . .

  • Idioma: Inglés

    Editorial: Elsevier Science Ltd, 2000

    0080430201 / 9780080430201

    • Tapa dura

    Librería: Revaluation Books, Exeter, Reino UnidoRevaluation Books

    Vendedor de 5 estrellas
    Contactar con el vendedor

    Condición: Nuevo

    EUR 691,61

    Envío por EUR 17,54 
    Se envía de Reino Unido a Estados Unidos de America

    Cantidad disponible: 1 disponibles

    Hardcover. Condición: Brand New. 633 pages. 9.50x6.75x1.25 inches. In Stock.

  • Idioma: Inglés

    Editorial: Elsevier Science & Technology, Oxford, 2000

    0080430201 / 9780080430201

    • Tapa dura

    Librería: AussieBookSeller, Truganina, VIC, AustraliaAussieBookSeller

    Vendedor de 5 estrellas
    Contactar con el vendedor

    Condición: Nuevo

    EUR 854,65

    Envío por EUR 32,04 
    Se envía de Australia a Estados Unidos de America

    Cantidad disponible: 1 disponibles

    Hardcover. Condición: new. Hardcover. This book covers a wide range of measurement techniques broadly referred to as Optical Metrology, with emphasis on their applications to nondestructive testing. If we look separately at each of the two terms making the generic name Optical Metrology, we find a link to two of the most distinctive aspects of humans: a particularly well developed sense of vision and a desire to classify things using numbers and rules.Of all our five senses, vision is certainly the most developed and the closest to the rational part of our brain. It can be argued that our memory is strongly dependent on images and the brain is particularly good at processing the stimuli received from these images to extract information. Measuring, sizing and counting are, on the other hand, among the fundamental building blocks of modern society. The use of abstract quantities like size, value or intensity has simplified the description of complex enquiry and is the basis of modern science and economy. Hence, it would seem natural that the combination of two such basic aspects should result in the birth of a new field of science. However, it is known that his has not been the case. Optical Metrology remains classified as a group of special techniques used mainly in niche applications. Optical Metrology may be rightly described as an ensemble of techniques in which fields such as physics, electrical and mechanical engineering, and computer science merge and blend in new ways.This book is intended as a tribute to the career of Professor Leopold Pflug. By looking back at his lifelong commitment to the application of optical metrology to the service of engineering sciences, more particularly devoted to the observation of the real behavior of structural components, one can retrace the major revolutions that have taken place in this domain. Starting his activity in 1971 as the head of the Laboratory for Stress Analysis at the EPFL in Switzerland, he first employed photoelasticity as a tool to improve the understanding of the real behavior of complex structures. However he soon recognized the necessity of working with the real materials used to build these structures instead of on replicas made of optically birefringent materials. He then focussed on the use of moire techniques which sparked his fascination with laser-based holography and speckle-based methods. The advent of information technology led him to open up to the use of ESPI and digital image processing techniques. Finally, in the mid 1990s he became interested in the use of optical fibers as a tool for sensing deformations inside structures, not only on their surfaces as in the case of whole-field methods. It is interesting to note the parallel in the evolution of optical metrology vis a vis developments in other fields: the development of lasers led to holographic interferometry, the availability of frame-grabbers led to ESPI and the emergence of fiber optic communications opened the way to the development of fiber optic sensors. This puts in sharp perspective the strong dependence of optical metrology on the latest technology for its development. Also interesting to note is that all fields in optical metrology touched upon by Professor Pflug are still of great relevance, as shown by the contributions in this volume.This book is, however, not intended as a commemoration, rather as an occasion to review the trends and undercurrents that are driving the field of optical metrology, with emphasis on nondestructive testing. All the authors were asked to summarize the recent achievements in their respective fields and to speculate about the future. As a result it has become apparent that it is difficult although not impossible to spot general trends in these disparate fields. Optical metrology has considerably benefited from some of the most important innovations of the recent past: lasers, c Shipping may be from our Sydney, NSW warehouse or from our UK or US warehouse, depending on stock availability.

  • Idioma: Inglés

    Editorial: Elsevier Science, 2000

    0080430201 / 9780080430201

    • Tapa dura
    • Impresión bajo demanda

    Librería: Brook Bookstore On Demand, Napoli, NA, ItaliaBrook Bookstore On Demand

    Vendedor de 5 estrellas
    Contactar con el vendedor

    Condición: Nuevo

    EUR 347,72

    Envío por EUR 11,00 
    Se envía de Italia a Estados Unidos de America

    Cantidad disponible: Más de 20 disponibles

    Condición: new. Questo è un articolo print on demand.

  • Idioma: Inglés

    Editorial: Elsevier Science Mai 2000, 2000

    0080430201 / 9780080430201

    • Tapa dura
    • Impresión bajo demanda

    Librería: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, AlemaniaBuchWeltWeit Ludwig Meier e.K.

    Vendedor de 5 estrellas
    Contactar con el vendedor

    Condición: Nuevo

    EUR 400,00

    Envío por EUR 23,00 
    Se envía de Alemania a Estados Unidos de America

    Cantidad disponible: 2 disponibles

    Buch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book covers a wide range of measurement techniques broadly referred to as Optical Metrology, with emphasis on their applications to nondestructive testing. If we look separately at each of the two terms making the generic name Optical Metrology, we find a link to two of the most distinctive aspects of humans: a particularly well developed sense of vision and a desire to classify things using numbers and rules. Of all our five senses, vision is certainly the most developed and the closest to the rational part of our brain. It can be argued that our memory is strongly dependent on images and the brain is particularly good at processing the stimuli received from these images to extract information. Measuring, sizing and counting are, on the other hand, among the fundamental building blocks of modern society. The use of abstract quantities like size, value or intensity has simplified the description of complex enquiry and is the basis of modern science and economy. Hence, it would seem natural that the combination of two such basic aspects should result in the birth of a new field of science. However, it is known that his has not been the case. Optical Metrology remains classified as a group of special techniques used mainly in niche applications. Optical Metrology may be rightly described as an ensemble of techniques in which fields such as physics, electrical and mechanical engineering, and computer science merge and blend in new ways. This book is intended as a tribute to the career of Professor Léopold Pflug. By looking back at his lifelong commitment to the application of optical metrology to the service of engineering sciences, more particularly devoted to the observation of the real behavior of structural components, one can retrace the major revolutions that have taken place in this domain. Starting his activity in 1971 as the head of the Laboratory for Stress Analysis at the EPFL in Switzerland, he first employed photoelasticity as a tool to improve the understanding of the real behavior of complex structures. However he soon recognized the necessity of working with the real materials used to build these structures instead of on replicas made of optically birefringent materials. He then focussed on the use of moiré techniques which sparked his fascination with laser-based holography and speckle-based methods. The advent of information technology led him to open up to the use of ESPI and digital image processing techniques. Finally, in the mid 1990s he became interested in the use of optical fibers as a tool for sensing deformations inside structures, not only on their surfaces as in the case of whole-field methods. It is interesting to note the parallel in the evolution of optical metrology vis à vis developments in other fields: the development of lasers led to holographic interferometry, the availability of frame-grabbers led to ESPI and the emergence of fiber optic communications opened the way to the development of fiber optic sensors. This puts in sharp perspective the strong dependence of optical metrology on the latest technology for its development. Also interesting to note is that all fields in optical metrology touched upon by Professor Pflug are still of great relevance, as shown by the contributions in this volume. This book is, however, not intended as a commemoration, rather as an occasion to review the trends and undercurrents that are driving the field of optical metrology, with emphasis on nondestructive testing. All the authors were asked to summarize the recent achievements in their respective fields and to speculate about the future. As a result it has become apparent that it is difficult although not impossible to spot general trends in these disparate fields. Optical metrology has considerably benefited from some of the most important innovations of the recent past: lasers, computers and fiber optics communication, all of which found their direct inspiration from the d 654 pp. Englisch.

  • Idioma: Inglés

    Editorial: Elsevier Science, 2000

    0080430201 / 9780080430201

    • Tapa dura
    • Impresión bajo demanda

    Librería: AHA-BUCH GmbH, Einbeck, AlemaniaAHA-BUCH GmbH

    Vendedor de 5 estrellas
    Contactar con el vendedor

    Condición: Nuevo

    EUR 553,38

    Envío por EUR 39,58 
    Se envía de Alemania a Estados Unidos de America

    Cantidad disponible: 1 disponibles

    Buch. Condición: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - This book covers a wide range of measurement techniques broadly referred to as Optical Metrology, with emphasis on their applications to nondestructive testing. If we look separately at each of the two terms making the generic name Optical Metrology, we find a link to two of the most distinctive aspects of humans: a particularly well developed sense of vision and a desire to classify things using numbers and rules. Of all our five senses, vision is certainly the most developed and the closest to the rational part of our brain. It can be argued that our memory is strongly dependent on images and the brain is particularly good at processing the stimuli received from these images to extract information. Measuring, sizing and counting are, on the other hand, among the fundamental building blocks of modern society. The use of abstract quantities like size, value or intensity has simplified the description of complex enquiry and is the basis of modern science and economy. Hence, it would seem natural that the combination of two such basic aspects should result in the birth of a new field of science. However, it is known that his has not been the case. Optical Metrology remains classified as a group of special techniques used mainly in niche applications. Optical Metrology may be rightly described as an ensemble of techniques in which fields such as physics, electrical and mechanical engineering, and computer science merge and blend in new ways. This book is intended as a tribute to the career of Professor Léopold Pflug. By looking back at his lifelong commitment to the application of optical metrology to the service of engineering sciences, more particularly devoted to the observation of the real behavior of structural components, one can retrace the major revolutions that have taken place in this domain. Starting his activity in 1971 as the head of the Laboratory for Stress Analysis at the EPFL in Switzerland, he first employed photoelasticity as a tool to improve the understanding of the real behavior of complex structures. However he soon recognized the necessity of working with the real materials used to build these structures instead of on replicas made of optically birefringent materials. He then focussed on the use of moiré techniques which sparked his fascination with laser-based holography and speckle-based methods. The advent of information technology led him to open up to the use of ESPI and digital image processing techniques. Finally, in the mid 1990s he became interested in the use of optical fibers as a tool for sensing deformations inside structures, not only on their surfaces as in the case of whole-field methods. It is interesting to note the parallel in the evolution of optical metrology vis à vis developments in other fields: the development of lasers led to holographic interferometry, the availability of frame-grabbers led to ESPI and the emergence of fiber optic communications opened the way to the development of fiber optic sensors. This puts in sharp perspective the strong dependence of optical metrology on the latest technology for its development. Also interesting to note is that all fields in optical metrology touched upon by Professor Pflug are still of great relevance, as shown by the contributions in this volume. This book is, however, not intended as a commemoration, rather as an occasion to review the trends and undercurrents that are driving the field of optical metrology, with emphasis on nondestructive testing. All the authors were asked to summarize the recent achievements in their respective fields and to speculate about the future. As a result it has become apparent that it is difficult although not impossible to spot general trends in these disparate fields. Optical metrology has considerably benefited from some of the most important innovations of the recent past: lasers, computers and fiber optics communication, all of which found their direct inspiration from the d.