grasserbauer wegscheider (16 resultados)

Condición: New.

Paperback. Condición: new. Paperback. Vol. 2 of "Progress in Materials Analysis" contains the lectures of the 12th Colloquium on Materials Analysis, Vienna, May 13-15, 1985. Due to the top level international participation from industry and research insti tutions the proceedings offer a survey of the present state and current trends in materials analysis of high actuality. The major topics covered are surface, micro and trace analysis of materials with a special emphasis on metals but also including other materials like ceramics, semiconductors, polymers. According to the strategy of the meeting attention is focussed on an interdisciplinary approach to materials science - combining analytical chemistry, solid state physics and technol ogy. Therefore progress reports on modern analytical technique like SIMS, SNMS, AES, XPS, Positron Annihilation Spectroscopy, EPMA, STEM, LAMMS, etc. are contained as well as presentations on the development of materials. The majority of the contributions centers on the treatment of important problems in materials science and technology by a (mostly sophisticated) combination of physical and chemical analytical techniques. Vienna, July 1985 M. Grasserbauer Contents Page Hercules, D. M. Surface Characterization of Thin Organic Films on Metals . . 2 of "Progress in Materials Analysis" contains the lectures of the 12th Colloquium on Materials Analysis, Vienna, May 13-15, 1985. The major topics covered are surface, micro and trace analysis of materials with a special emphasis on metals but also including other materials like ceramics, semiconductors, polymers. Shipping may be from multiple locations in the US or from the UK, depending on stock availability.

Condición: New.

Condición: New. In.

PF. Condición: New.

Condición: New. pp. 396.

Paperback. Condición: Brand New. reprint edition. 396 pages. 9.02x5.98x0.93 inches. In Stock.

Condición: New.

Taschenbuch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - Vol. 2 of 'Progress in Materials Analysis' contains the lectures of the 12th Colloquium on Materials Analysis, Vienna, May 13-15, 1985. Due to the top level international participation from industry and research insti tutions the proceedings offer a survey of the present state and current trends in materials analysis of high actuality. The major topics covered are surface, micro and trace analysis of materials with a special emphasis on metals but also including other materials like ceramics, semiconductors, polymers. According to the strategy of the meeting attention is focussed on an interdisciplinary approach to materials science - combining analytical chemistry, solid state physics and technol ogy. Therefore progress reports on modern analytical technique like SIMS, SNMS, AES, XPS, Positron Annihilation Spectroscopy, EPMA, STEM, LAMMS, etc. are contained as well as presentations on the development of materials. The majority of the contributions centers on the treatment of important problems in materials science and technology by a (mostly sophisticated) combination of physical and chemical analytical techniques. Vienna, July 1985 M. Grasserbauer Contents Page Hercules, D. M. Surface Characterization of Thin Organic Films on Metals . .

Paperback. Condición: Very Good. Very Good. book.

Paperback. Condición: new. Paperback. Vol. 2 of "Progress in Materials Analysis" contains the lectures of the 12th Colloquium on Materials Analysis, Vienna, May 13-15, 1985. Due to the top level international participation from industry and research insti tutions the proceedings offer a survey of the present state and current trends in materials analysis of high actuality. The major topics covered are surface, micro and trace analysis of materials with a special emphasis on metals but also including other materials like ceramics, semiconductors, polymers. According to the strategy of the meeting attention is focussed on an interdisciplinary approach to materials science - combining analytical chemistry, solid state physics and technol ogy. Therefore progress reports on modern analytical technique like SIMS, SNMS, AES, XPS, Positron Annihilation Spectroscopy, EPMA, STEM, LAMMS, etc. are contained as well as presentations on the development of materials. The majority of the contributions centers on the treatment of important problems in materials science and technology by a (mostly sophisticated) combination of physical and chemical analytical techniques. Vienna, July 1985 M. Grasserbauer Contents Page Hercules, D. M. Surface Characterization of Thin Organic Films on Metals . . 2 of "Progress in Materials Analysis" contains the lectures of the 12th Colloquium on Materials Analysis, Vienna, May 13-15, 1985. The major topics covered are surface, micro and trace analysis of materials with a special emphasis on metals but also including other materials like ceramics, semiconductors, polymers. Shipping may be from our Sydney, NSW warehouse or from our UK or US warehouse, depending on stock availability.

Condición: New. Print on Demand pp. 396 23:B&W 6 x 9 in or 229 x 152 mm Perfect Bound on White w/Gloss Lam.

Condición: New. PRINT ON DEMAND pp. 396.

Taschenbuch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Vol. 2 of 'Progress in Materials Analysis' contains the lectures of the 12th Colloquium on Materials Analysis, Vienna, May 13-15, 1985. Due to the top level international participation from industry and research insti tutions the proceedings offer a survey of the present state and current trends in materials analysis of high actuality. The major topics covered are surface, micro and trace analysis of materials with a special emphasis on metals but also including other materials like ceramics, semiconductors, polymers. According to the strategy of the meeting attention is focussed on an interdisciplinary approach to materials science - combining analytical chemistry, solid state physics and technol ogy. Therefore progress reports on modern analytical technique like SIMS, SNMS, AES, XPS, Positron Annihilation Spectroscopy, EPMA, STEM, LAMMS, etc. are contained as well as presentations on the development of materials. The majority of the contributions centers on the treatment of important problems in materials science and technology by a (mostly sophisticated) combination of physical and chemical analytical techniques. Vienna, July 1985 M. Grasserbauer Contents Page Hercules, D. M. Surface Characterization of Thin Organic Films on Metals . . 396 pp. Englisch.

Taschenbuch. Condición: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Vol. 2 of 'Progress in Materials Analysis' contains the lectures of the 12th Colloquium on Materials Analysis, Vienna, May 13-15, 1985. Due to the top level international participation from industry and research insti tutions the proceedings offer a survey of the present state and current trends in materials analysis of high actuality. The major topics covered are surface, micro and trace analysis of materials with a special emphasis on metals but also including other materials like ceramics, semiconductors, polymers. According to the strategy of the meeting attention is focussed on an interdisciplinary approach to materials science - combining analytical chemistry, solid state physics and technol ogy. Therefore progress reports on modern analytical technique like SIMS, SNMS, AES, XPS, Positron Annihilation Spectroscopy, EPMA, STEM, LAMMS, etc. are contained as well as presentations on the development of materials. The majority of the contributions centers on the treatment of important problems in materials science and technology by a (mostly sophisticated) combination of physical and chemical analytical techniques. Vienna, July 1985 M. Grasserbauer Contents Page Hercules, D. M. Surface Characterization of Thin Organic Films on Metals . .Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 396 pp. Englisch.

Taschenbuch. Condición: Neu. Progress in Materials Analysis | Vol. 2 | M. Grasserbauer (u. a.) | Taschenbuch | x | Englisch | 1985 | Springer | EAN 9783211819050 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu Print on Demand.