VLSI-SoC: Technologies for Systems Integration: 17th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2009, . and Communication Technology, 360)

ISBN 10: 3642231195 ISBN 13: 9783642231193

Editorial: Springer, 2011

Idioma: Ingl�s

Condici�n: Nuevo Encuadernaci�n de tapa dura

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Detalles bibliogr�ficos

T�tulo: VLSI-SoC: Technologies for Systems Integration: 17th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2009, . and Communication Technology, 360)
Editor: Springer
Fecha de publicaci�n: 2011
Idioma: Ingl�s
ISBN 10: 3642231195
ISBN 13: 9783642231193
Encuadernaci�n: Encuadernaci�n de tapa dura
Estado: New

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Sinopsis

This book contains extended and revised versions of the best papers presented at the 17th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2009, held in Florian�polis, Brazil, in October 2009. The 8 papers included in the book together with two keynote talks were carefully reviewed and selected from 27 papers presented at the conference. The papers cover a wide variety of excellence in VLSI technology and advanced research addressing the current trend toward increasing chip integration and technology process advancements bringing about stimulating new challenges both at the physical and system-design levels, as well as in the test of theses systems.

De la contraportada

This book contains extended and revised versions of the best papers presented at the 17th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2009, held in Florian�polis, Brazil, in October 2009. The 8 papers included in the book together with two keynote talks were carefully reviewed and selected from 27 papers presented at the conference. The papers cover a wide variety of excellence in VLSI technology and advanced research addressing the current trend toward increasing chip integration and technology process advancements bringing about stimulating new challenges both at the physical and system-design levels, as well as in the test of theses systems.

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