Transmission Electron Microscopy and Diffractometry of Materials
Fultz, Brent; Howe, James M.
ISBN 10: 3642433154 ISBN 13: 9783642433153
Editorial: Springer, 2014
Nuevos
Encuadernación de tapa blanda
Librería:
GreatBookPrices, Columbia, MD, Estados Unidos de America
Calificación del vendedor: 5 de 5 estrellas
Vendedor de AbeBooks desde 6 de abril de 2009
Este artículo en concreto ya no está disponible.
Descripción
Descripción:
N° de ref. del artículo 22163896-n
Sinopsis:
This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds important new techniques of TEM such as electron tomography, nanobeam diffraction, and geometric phase analysis. A new chapter on neutron scattering completes the trio of x-ray, electron and neutron diffraction. All chapters were updated and revised for clarity. The book explains the fundamentals of how waves and wavefunctions interact with atoms in solids, and the similarities and differences of using x-rays, electrons, or neutrons for diffraction measurements. Diffraction effects of crystalline order, defects, and disorder in materials are explained in detail. Both practical and theoretical issues are covered. The book can be used in an introductory-level or advanced-level course, since sections are identified by difficulty. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises.
Acerca del autor:
Brent Fultz is a Professor of Materials Science and Applied Physics at California Institute of Technology, Pasadena. He is the successful co-author of a book on Transmission Electron Microscopy and Diffractometry of Materials.
James Howe is a Professor of Materials Science and Engineering at the University of Virginia, Charlottesville. He successfully co-authored the book Transmission Electron Microscopy and Diffractometry of Materials.
"Sobre este título" puede pertenecer a otra edición de este libro.
Detalles bibliográficos
Título: Transmission Electron Microscopy and ...
Editorial: Springer
Año de publicación: 2014
Encuadernación: Encuadernación de tapa blanda
Condición: New
Edición: 4ª Edición
Los mejores resultados en AbeBooks
Imagen de archivo
Transmission Electron Microscopy and Diffractometry of Materials
Librería: Basi6 International, Irving, TX, Estados Unidos de America
Calificación del vendedor: 5 de 5 estrellas
Condición: Brand New. New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service. Nº de ref. del artículo: ABEOCT25-246384
Cantidad disponible: 1 disponibles
Imagen del vendedor
Transmission Electron Microscopy and Diffractometry of Materials
Publicado por
Springer Berlin Heidelberg, 2014
ISBN 10: 3642433154
ISBN 13: 9783642433153
Nuevo
Tapa blanda
Librería: moluna, Greven, Alemania
Calificación del vendedor: 4 de 5 estrellas
Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. New edition of successful, well-reviewed textbook Provides an integrated coverage of transmission electron microscopy and x-ray diffractometry Shows how wave radiation probes the structure of materials Supports learning and teaching . Nº de ref. del artículo: 5060702
Gastos de envío:
EUR 48,99
De Alemania a Estados Unidos de America
Destinos, gastos y plazos de envío
Cantidad disponible: Más de 20 disponibles
Transmission Electron Microscopy and Diffractometry of Materials
Publicado por
Springer-Verlag GmbH, 2014
ISBN 10: 3642433154
ISBN 13: 9783642433153
Nuevo
Taschenbuch
Librería: preigu, Osnabrück, Alemania
Calificación del vendedor: 5 de 5 estrellas
Taschenbuch. Condición: Neu. Transmission Electron Microscopy and Diffractometry of Materials | James Howe (u. a.) | Taschenbuch | xx | Englisch | 2014 | Springer-Verlag GmbH | EAN 9783642433153 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu. Nº de ref. del artículo: 105023439
Gastos de envío:
EUR 70,00
De Alemania a Estados Unidos de America
Destinos, gastos y plazos de envío
Cantidad disponible: 5 disponibles
Imagen de archivo
Transmission Electron Microscopy and Diffractometry of Materials (Graduate Texts in Physics)
Librería: Ria Christie Collections, Uxbridge, Reino Unido
Calificación del vendedor: 5 de 5 estrellas
Condición: New. In. Nº de ref. del artículo: ria9783642433153_new
Gastos de envío:
EUR 13,80
De Reino Unido a Estados Unidos de America
Destinos, gastos y plazos de envío
Cantidad disponible: Más de 20 disponibles
Imagen de archivo
Transmission Electron Microscopy and Diffractometry of Materials (Graduate Texts in Physics)
Librería: Chiron Media, Wallingford, Reino Unido
Calificación del vendedor: 4 de 5 estrellas
Paperback. Condición: New. Nº de ref. del artículo: 6666-IUK-9783642433153
Gastos de envío:
EUR 17,84
De Reino Unido a Estados Unidos de America
Destinos, gastos y plazos de envío
Cantidad disponible: 10 disponibles
Imagen del vendedor
Transmission Electron Microscopy and Diffractometry of Materials
Publicado por
Springer Berlin Heidelberg, Springer Berlin Heidelberg Nov 2014, 2014
ISBN 10: 3642433154
ISBN 13: 9783642433153
Nuevo
Taschenbuch
Librería: buchversandmimpf2000, Emtmannsberg, BAYE, Alemania
Calificación del vendedor: 5 de 5 estrellas
Taschenbuch. Condición: Neu. Neuware -This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds important new techniques of TEM such as electron tomography, nanobeam diffraction, and geometric phase analysis. A new chapter on neutron scattering completes the trio of x-ray, electron and neutron diffraction. All chapters were updated and revised for clarity. The book explains the fundamentals of how waves and wavefunctions interact with atoms in solids, and the similarities and differences of using x-rays, electrons, or neutrons for diffraction measurements. Diffraction effects of crystalline order, defects, and disorder in materials are explained in detail. Both practical and theoretical issues are covered. The book can be used in an introductory-level or advanced-level course, since sections are identified by difficulty. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 784 pp. Englisch. Nº de ref. del artículo: 9783642433153
Gastos de envío:
EUR 60,00
De Alemania a Estados Unidos de America
Destinos, gastos y plazos de envío
Cantidad disponible: 2 disponibles
Imagen del vendedor
Transmission Electron Microscopy and Diffractometry of Materials
Publicado por
Springer Berlin Heidelberg, 2014
ISBN 10: 3642433154
ISBN 13: 9783642433153
Nuevo
Taschenbuch
Librería: AHA-BUCH GmbH, Einbeck, Alemania
Calificación del vendedor: 5 de 5 estrellas
Taschenbuch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds important new techniques of TEM such as electron tomography, nanobeam diffraction, and geometric phase analysis. A new chapter on neutron scattering completes the trio of x-ray, electron and neutron diffraction. All chapters were updated and revised for clarity. The book explains the fundamentals of how waves and wavefunctions interact with atoms in solids, and the similarities and differences of using x-rays, electrons, or neutrons for diffraction measurements. Diffraction effects of crystalline order, defects, and disorder in materials are explained in detail. Both practical and theoretical issues are covered. The book can be used in an introductory-level or advanced-level course, since sections are identified by difficulty. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises. Nº de ref. del artículo: 9783642433153
Gastos de envío:
EUR 65,83
De Alemania a Estados Unidos de America
Destinos, gastos y plazos de envío
Cantidad disponible: 1 disponibles
Imagen del vendedor
Transmission Electron Microscopy and Diffractometry of Materials
Publicado por
Springer Berlin Heidelberg Nov 2014, 2014
ISBN 10: 3642433154
ISBN 13: 9783642433153
Nuevo
Taschenbuch
Librería: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Alemania
Calificación del vendedor: 5 de 5 estrellas
Taschenbuch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds important new techniques of TEM such as electron tomography, nanobeam diffraction, and geometric phase analysis. A new chapter on neutron scattering completes the trio of x-ray, electron and neutron diffraction. All chapters were updated and revised for clarity. The book explains the fundamentals of how waves and wavefunctions interact with atoms in solids, and the similarities and differences of using x-rays, electrons, or neutrons for diffraction measurements. Diffraction effects of crystalline order, defects, and disorder in materials are explained in detail. Both practical and theoretical issues are covered. The book can be used in an introductory-level or advanced-level course, since sections are identified by difficulty. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises. 784 pp. Englisch. Nº de ref. del artículo: 9783642433153
Gastos de envío:
EUR 23,00
De Alemania a Estados Unidos de America
Destinos, gastos y plazos de envío
Cantidad disponible: 2 disponibles
Imagen de archivo
Transmission Electron Microscopy and Diffractometry of Materials (Graduate Texts in Physics)
Librería: Lucky's Textbooks, Dallas, TX, Estados Unidos de America
Calificación del vendedor: 5 de 5 estrellas
Condición: New. Nº de ref. del artículo: ABLIING23Mar3113020227428
Cantidad disponible: Más de 20 disponibles
Imagen de archivo
Transmission Electron Microscopy and Diffractometry of Materials (Paperback)
Publicado por
Springer-Verlag Berlin and Heidelberg GmbH & Co. KG, Berlin, 2014
ISBN 10: 3642433154
ISBN 13: 9783642433153
Nuevo
Paperback
Librería: Grand Eagle Retail, Bensenville, IL, Estados Unidos de America
Calificación del vendedor: 5 de 5 estrellas
Paperback. Condición: new. Paperback. This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds important new techniques of TEM such as electron tomography, nanobeam diffraction, and geometric phase analysis. A new chapter on neutron scattering completes the trio of x-ray, electron and neutron diffraction. All chapters were updated and revised for clarity. The book explains the fundamentals of how waves and wavefunctions interact with atoms in solids, and the similarities and differences of using x-rays, electrons, or neutrons for diffraction measurements. Diffraction effects of crystalline order, defects, and disorder in materials are explained in detail. Both practical and theoretical issues are covered. The book can be used in an introductory-level or advanced-level course, since sections are identified by difficulty. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises. This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. Shipping may be from multiple locations in the US or from the UK, depending on stock availability. Nº de ref. del artículo: 9783642433153
Cantidad disponible: 1 disponibles