Transmission Electron Microscopy and Diffractometry of Materials
Fultz, Brent; Howe, James
ISBN 10: 3642297609 ISBN 13: 9783642297601
Editorial: Springer, 2012
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Descripción
Descripción:
N° de ref. del artículo 17848466-n
Sinopsis:
This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds important new techniques of TEM such as electron tomography, nanobeam diffraction, and geometric phase analysis. A new chapter on neutron scattering completes the trio of x-ray, electron and neutron diffraction. All chapters were updated and revised for clarity. The book explains the fundamentals of how waves and wavefunctions interact with atoms in solids, and the similarities and differences of using x-rays, electrons, or neutrons for diffraction measurements. Diffraction effects of crystalline order, defects, and disorder in materials are explained in detail. Both practical and theoretical issues are covered. The book can be used in an introductory-level or advanced-level course, since sections are identified by difficulty. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises.
Acerca del autor:
Brent Fultz is a Professor of Materials Science and Applied Physics at California Institute of Technology, Pasadena. He is the successful co-author of a book on Transmission Electron Microscopy and Diffractometry of Materials.
James Howe is a Professor of Materials Science and Engineering at the University of Virginia, Charlottesville. He successfully co-authored the book Transmission Electron Microscopy and Diffractometry of Materials.
"Sobre este título" puede pertenecer a otra edición de este libro.
Detalles bibliográficos
Título: Transmission Electron Microscopy and ...
Editorial: Springer
Año de publicación: 2012
Encuadernación: Encuadernación de tapa dura
Condición: New
Edición: 4ª Edición
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Transmission Electron Microscopy and Diffractometry of Materials
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Gebunden. Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. New edition of successful, well-reviewed textbook Provides an integrated coverage of transmission electron microscopy and x-ray diffractometry Shows how wave radiation probes the structure of materials Supports learning and teaching . Nº de ref. del artículo: 5056013
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Buch. Condición: Neu. Transmission Electron Microscopy and Diffractometry of Materials | James Howe (u. a.) | Buch | xx | Englisch | 2012 | Springer-Verlag GmbH | EAN 9783642297601 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu Print on Demand. Nº de ref. del artículo: 106514026
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Springer Berlin Heidelberg, 2012
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Springer Berlin Heidelberg, Springer Berlin Heidelberg Okt 2012, 2012
ISBN 10: 3642297609
ISBN 13: 9783642297601
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Buch. Condición: Neu. Neuware -This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds important new techniques of TEM such as electron tomography, nanobeam diffraction, and geometric phase analysis. A new chapter on neutron scattering completes the trio of x-ray, electron and neutron diffraction. All chapters were updated and revised for clarity. The book explains the fundamentals of how waves and wavefunctions interact with atoms in solids, and the similarities and differences of using x-rays, electrons, or neutrons for diffraction measurements. Diffraction effects of crystalline order, defects, and disorder in materials are explained in detail. Both practical and theoretical issues are covered. The book can be used in an introductory-level or advanced-level course, since sections are identified by difficulty. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 784 pp. Englisch. Nº de ref. del artículo: 9783642297601
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Springer Berlin Heidelberg Okt 2012, 2012
ISBN 10: 3642297609
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Transmission Electron Microscopy and Diffractometry of Materials (Hardcover)
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Springer-Verlag Berlin and Heidelberg GmbH & Co. KG, Berlin, 2012
ISBN 10: 3642297609
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ISBN 10: 3642297609
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Hardcover. Condición: new. Hardcover. This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds important new techniques of TEM such as electron tomography, nanobeam diffraction, and geometric phase analysis. A new chapter on neutron scattering completes the trio of x-ray, electron and neutron diffraction. All chapters were updated and revised for clarity. The book explains the fundamentals of how waves and wavefunctions interact with atoms in solids, and the similarities and differences of using x-rays, electrons, or neutrons for diffraction measurements. Diffraction effects of crystalline order, defects, and disorder in materials are explained in detail. Both practical and theoretical issues are covered. The book can be used in an introductory-level or advanced-level course, since sections are identified by difficulty. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises. This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. Shipping may be from our Sydney, NSW warehouse or from our UK or US warehouse, depending on stock availability. Nº de ref. del artículo: 9783642297601
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