Terrestrial Radiation Effects in ULSI Devices and Electronic Systems

Idioma: inglés

Editorial: John Wiley and Sons Inc, US, 2015

1118479297 / 9781118479292

Librería: Rarewaves.com UK, London, Reino UnidoRarewaves.com UK

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Descripción del artículo del vendedor

This book provides the reader with knowledge on a wide variety of radiation fields and their effects on the electronic devices and systems. The author covers faults and failures in ULSI devices induced by a wide variety of radiation fields, including electrons, alpha-rays, muons, gamma rays, neutrons and heavy ions. Readers will learn how to make numerical models from physical insights, to determine the kind of mathematical approaches that should be implemented to analyze radiation effects. A wide variety of prediction, detection, characterization and mitigation techniques against soft-errors are reviewed and discussed. The author shows how to model sophisticated radiation effects in condensed matter in order to quantify and control them, and explains how electronic systems including servers and routers are shut down due to environmental radiation.  Provides an understanding of how electronic systems are shut down due to environmental radiation by constructing physical models and numerical algorithmsCovers both terrestrial and avionic-level conditionsLogically presented with each chapter explaining the background physics to the topic followed by various modelling techniques, and chapter summaryWritten by a widely-recognized authority in soft-errors in electronic devicesCode samples available for download from the Companion Website This book is targeted at researchers and graduate students in nuclear and space radiation, semiconductor physics and electron devices, as well as other areas of applied physics modelling. Researchers and students interested in how a variety of physical phenomena can be modelled and numerically treated will also find this book to present helpful methods.…

N° de ref. del artículo LU-9781118479292

Título
Terrestrial Radiation Effects in ULSI Devices and Electronic Systems
Autor
Eishi H. Ibe
Editorial
John Wiley and Sons Inc, US
Año de publicación
2015
Estado
New
Encuadernación
Hardback
Idioma
inglés
ISBN 10
1118479297
ISBN 13
9781118479292
Peso del artículo
599 gramos

Rarewaves.com UK

London, Reino Unido

Vendedor de 5 estrellas

Vendedor de IberLibro desde 11 de junio de 2025

Tarifas de envío de Reino Unido a Estados Unidos de America

ArtículoDe 60 a 60 días hábilesDe 60 a 60 días hábiles
Primer artículoEUR 77,61EUR 119,40
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