Synthesis & Characterization of Bi2Se3 & Bi2-xPbxSe3 Ternary Compound: Thin Films. Este artículo no está disponible.
Idioma: inglés
Editorial: LAP LAMBERT Academic Publishing, 2016
- Tapa blanda
- Nuevo

Librería: Books Puddle, Woodside, NY, Estados Unidos de AmericaBooks Puddle
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Vendedor de IberLibro desde 22 de noviembre de 2018
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Condición: Nuevo
EUR 66,37
N° de ref. del artículo 26405915541
- Título
- Synthesis & Characterization of Bi2Se3 & Bi2-xPbxSe3 Ternary Compound: Thin Films
- Autor
- Gujarathi, Dhananjay; Patil, Vishwanath
- Editorial
- LAP LAMBERT Academic Publishing
- Año de publicación
- 2016
- Estado
- New
- Encuadernación
- Encuadernación de tapa blanda
- Idioma
- inglés
- ISBN 10
- 3659857173
- ISBN 13
- 9783659857171
Thin film science has received tremendous attention in last six decades especially after the word war-II, because of numerous and widespread applications of thin films in diverse fields such as electronic industries, micro-electronics and hybrid circuits, optical devices, sensors, superconductivity and recently high memory computer elements etc. This book entitled " Synthesis and Characterization of Bi2Se3 and Bi2-xPbxSe3 ternary compound thin film" covers the evaluation of particle size from Scherrer's formula, evaluation of optical band gap as well as optical constants such as refractive indices and extinction coefficient and photo-sensitivity nature of thin film.
“Sinopsis” puede pertenecer a otra edición de este título.
Reseña del editor
Thin film science has received tremendous attention in last six decades especially after the word war-II, because of numerous and widespread applications of thin films in diverse fields such as electronic industries, micro-electronics and hybrid circuits, optical devices, sensors, superconductivity and recently high memory computer elements etc. This book entitled " Synthesis and Characterization of Bi2Se3 and Bi2-xPbxSe3 ternary compound thin film" covers the evaluation of particle size from Scherrer's formula, evaluation of optical band gap as well as optical constants such as refractive indices and extinction coefficient and photo-sensitivity nature of thin film.
“Acerca de” puede pertenecer a otra edición de este título.