Scanning Electron Microscopy and X-Ray Microanalysis

43 valoraciones de Goodreads

Idioma: inglés

Editorial: Humana, 2018

1493982699 / 9781493982691

  • Tapa blanda
  • Nuevo
Ver todos los detalles

Librería: AHA-BUCH GmbH, Einbeck, AlemaniaAHA-BUCH GmbH

Vendedor de 5 estrellas

Vendedor de IberLibro desde 14 de agosto de 2006

Tapa blanda

Condición: Nuevo

EUR 122,65

Envío por EUR 46,01 
Se envía de Alemania a Estados Unidos de America

Cantidad disponible: 1 disponible

Añadir al carrito
Devoluciones gratuitas de 30 días

Descripción del artículo del vendedor

nach der Bestellung gedruckt Neuware - Printed after ordering - This thoroughly revised and updated Fourth Edition of a time-honored text provides the reader with a comprehensive introduction to the field of scanning electron microscopy (SEM), energy dispersive X-ray spectrometry (EDS) for elemental microanalysis, electron backscatter diffraction analysis (EBSD) for micro-crystallography, and focused ion beams. Students and academic researchers will find the text to be an authoritative and scholarly resource, while SEM operators and a diversity of practitioners - engineers, technicians, physical and biological scientists, clinicians, and technical managers - will find that every chapter has been overhauled to meet the more practical needs of the technologist and working professional. In a break with the past, this Fourth Edition de-emphasizes the design and physical operating basis of the instrumentation, including the electron sources, lenses, detectors, etc. In the modern SEM, many of the low level instrument parameters are now controlled and optimized by the microscope's software, and user access is restricted. Although the software control system provides efficient and reproducible microscopy and microanalysis, the user must understand the parameter space wherein choices are made to achieve effective and meaningful microscopy, microanalysis, and micro-crystallography. Therefore, special emphasis is placed on beam energy, beam current, electron detector characteristics and controls, and ancillary techniques such as energy dispersive x-ray spectrometry (EDS) and electron backscatter diffraction (EBSD).With 13 years between the publication of the third and fourth editions, new coverage reflects the many improvements in the instrument and analysis techniques. The SEM has evolved into a powerful and versatile characterization platform in which morphology, elemental composition, and crystal structure can be evaluated simultaneously. Extension of the SEM into a 'dual beam' platform incorporating bothelectron and ion columns allows precision modification of the specimen by focused ion beam milling. New coverage in the Fourth Edition includes the increasing use of field emission guns and SEM instruments with high resolution capabilities, variable pressure SEM operation, theory, and measurement of x-rays with high throughput silicon drift detector (SDD-EDS) x-ray spectrometers. In addition to powerful vendor- supplied software to support data collection and processing, the microscopist can access advanced capabilities available in free, open source software platforms, including the National Institutes of Health (NIH) ImageJ-Fiji for image processing and the National Institute of Standards and Technology (NIST) DTSA II for quantitative EDS x-ray microanalysis and spectral simulation, both of which are extensively used in this work. However, the user has a responsibility to bring intellect, curiosity, and a proper skepticism to information on a computer screen and to the entire measurement process. This book helps you to achieve this goal.Realigns the text with the needs of a diverse audience from researchers and graduate students to SEM operators and technical managersEmphasizes practical, hands-on operation of the microscope, particularly user selection of the critical operating parameters to achieve meaningful resultsProvides step-by-step overviews of SEM, EDS, and EBSD and checklists of critical issues for SEM imaging, EDS x-ray microanalysis, and EBSD crystallographic measurementsMakes extensive use of open source software: NIH ImageJ-FIJI for image processing and NIST DTSA II for quantitative EDS x-ray microanalysis and EDS spectral simulation.Includes case studies to illustrate practical problem solvingCovers Helium ion scanning microscopyOrganized into relatively self-contained modules - no need to 'read it all' to understand a topicIncludesan.…

Título
Scanning Electron Microscopy and X-Ray Microanalysis
Autor
Nicholas W. M. Ritchie
Editorial
Humana
Año de publicación
2018
Estado
Neu
Encuadernación
Taschenbuch
Idioma
inglés
ISBN 10
1493982699
ISBN 13
9781493982691
Edición
4ª Edición
Peso del artículo
1573 gramos
Dimensiones
279x210x29 mm

AHA-BUCH GmbH

Einbeck, Alemania

Vendedor de 5 estrellas

Vendedor de IberLibro desde 14 de agosto de 2006

Tarifas de envío de Alemania a Estados Unidos de America

ArtículoDe 7 a 10 días hábilesDe 5 a 7 días hábiles
Primer artículoEUR 46,01EUR 63,88
Los plazos de entrega los establecen los vendedores y varían según el transportista y la ubicación. Los pedidos que pasan por la aduana pueden sufrir retrasos y los compradores son responsables de los aranceles o tarifas asociadas. Los vendedores pueden ponerse en contacto con usted en relación con cargos adicionales para cubrir cualquier aumento en los costes de envío de los artículos.

Métodos de pago

  • Visa
  • Mastercard
  • American Express
  • Carte Bleue
  • Apple Pay
  • Google Pay
  • Cheque
  • Giro bancario
  • PayPal

Descripción de la tienda

Das Unternehmen AHA-BUCH GmbH: Seit der Gründung von AHA-BUCH im Juli 2005 ist unser Hauptziel, zufriedenen Kunden so schnell und so preisgünstig wie möglich ihren Bücherwunsch zu erfüllen. Unsere Firma beschäftigt 16 Mitarbeiter, die nur ein Ziel kennen: den Kunden und seine Wünsche! Auf über 3700 m2 Fläche haben wir über 100.000 Bücher, Modernes Antiquariat und Spiele auf Lager.

Especialidad

Kinderbücher & Kinderhör Casetten, German Books, Software, Natur & Tiere, Ratgeber, Sachbücher, Englische Bücher, Medizin & Gesundheit, Universität & Studium

Información empresarial del vendedor

AHA-BUCH GmbH

Garlebsen 48
Einbeck, Alemania 37574

IImprint

Información del vendedor

AHA-BUCH GmbH
representado por el director gerente Christel Glass
Garlebsen 48
37574 Einbeck
Alemania
Teléfono: 055639996039
Fax: 055639995974
E-Mail: abebooks@aha-buch.de
USt-IdNr.: DE261904229
Inscrita en el Registro Mercantil Amtsgerichtes Göttingen
Handelsregisternummer HRB 200691

Resolución alternativa de conflictos:
La Comisión Europea proporciona una plataforma para la resolución extrajudicial de litigios en línea (plataforma ODR), a la que se puede acceder en https://ec.europa.eu/odr.

Somos miembros de la iniciativa "FairCommerce" desde el 25.05.2018.
Para obtener más información, consulte www.fair-commerce.de.