Reliability Improvement Technology for Power Converters. Este artículo no está disponible.
Idioma: inglés
Editorial: Springer, 2017
- Tapa dura
- Nuevo

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N° de ref. del artículo ABEOCT25-258709
- Título
- Reliability Improvement Technology for Power Converters
- Autor
- Kyo Beum Lee
- Editorial
- Springer
- Año de publicación
- 2017
- Estado
- Brand New
- Encuadernación
- Encuadernación de tapa dura
- Idioma
- inglés
- ISBN 10
- 9811049912
- ISBN 13
- 9789811049910
- Serie
- Libro 97 de 153: Power Systems
This book describes how to design circuits in power electronics systems using a reliability approach in three-level topologies, which have many advantages in terms of the current total harmonic distortion and efficiency. Such converter types are increasingly used in large power applications and photovoltaics (PV), therefore research on improvements in the reliability of such systems using multi-level topologies has become important. Four studies for reliability improvement are contained in this book: an open-circuited switch fault detection scheme, tolerance control for an open-circuited switch fault, neutral-point voltage ripple reduction, and leakage current reduction. This book treats not only the topology, but also the fault tolerance and the reduction of the ripples and leakage. This book is aimed at advanced students of electrical engineering and power electronics specialists.
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Acerca del autor
June-Seok Lee received the B.S., M.S., and Ph.D. degrees in electrical and computer engineering from Ajou University, Suwon, Korea, in 2011, 2013, and 2015, respectively. Since 2015, he has been with the Korea Railroad Research Institute, Uiwang, Korea. His research interests include grid-connected systems, multilevel inverters and reliability.
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