Process Variations and Probabilistic Integrated Circuit Design
. Ed(s): Dietrich, Manfred; Haase, Joachim
ISBN 10: 144196620X ISBN 13: 9781441966209
Editorial: Springer-Verlag New York Inc., 2011
Nuevos
Encuadernación de tapa dura
Librería:
Kennys Bookstore, Olney, MD, Estados Unidos de America
Calificación del vendedor: 5 de 5 estrellas
Vendedor de AbeBooks desde 9 de octubre de 2009
Este artículo en concreto ya no está disponible.
Descripción
Descripción:
Based on qualitative and quantitative insight, this volume presents the technological, physical, and mathematical fundamentals for a design paradigm shift for microelectronic circuits. The text explores design flow variations to establish different variants while optimizing the overall design. Editor(s): Dietrich, Manfred; Haase, Joachim. Num Pages: 252 pages, 32 black & white tables, biography. BIC Classification: TJFC; UGC. Category: (P) Professional & Vocational. Dimension: 235 x 155 x 18. Weight in Grams: 567. . 2011. 2012. Hardback. . . . . Books ship from the US and Ireland. N° de ref. del artículo V9781441966209
Sinopsis:
Uncertainty in key parameters within a chip and between different chips in the deep sub micron area plays a more and more important role. As a result, manufacturing process spreads need to be considered during the design process. Quantitative methodology is needed to ensure faultless functionality, despite existing process variations within given bounds, during product development. This book presents the technological, physical, and mathematical fundamentals for a design paradigm shift, from a deterministic process to a probability-orientated design process for microelectronic circuits. Readers will learn to evaluate the different sources of variations in the design flow in order to establish different design variants, while applying appropriate methods and tools to evaluate and optimize their design.
De la contraportada:
Uncertainty in key parameters within a chip and between different chips in the deep sub micron era plays a more and more important role. As a result, manufacturing process spreads need to be considered during the design process. Quantitative methodology is needed to ensure faultless functionality, despite existing process variations within given bounds, during product development.
This book presents the technological, physical, and mathematical fundamentals for a design paradigm shift, from a deterministic process to a probability-orientated design process for microelectronic circuits. Readers will learn to evaluate the different sources of variations in the design flow in order to establish different design variants, while applying appropriate methods and tools to evaluate and optimize their design.
- Trains IC designers to recognize problems caused by parameter variations during manufacturing and to choose the best methods available to mitigate these issues during the design process;
- Offers both qualitative and quantitative insight into critical effects of process variation from perspectives of manufacturing, electronic design automation and circuit design;
- Describes critical effects of process variation using simple examples that can be reproduced by the reader.
"Sobre este título" puede pertenecer a otra edición de este libro.
Detalles bibliográficos
Título: Process Variations and Probabilistic ...
Editorial: Springer-Verlag New York Inc.
Año de publicación: 2011
Encuadernación: Encuadernación de tapa dura
Condición: New
Los mejores resultados en AbeBooks
Imagen de archivo
Process Variations and Probabilistic Integrated Circuit Design.
Publicado por
New York, Springer., 2012
ISBN 10: 144196620X
ISBN 13: 9781441966209
Antiguo o usado
Tapa dura
Librería: Universitätsbuchhandlung Herta Hold GmbH, Berlin, Alemania
Calificación del vendedor: 5 de 5 estrellas
XVI, 249 p. Hardcover. Versand aus Deutschland / We dispatch from Germany via Air Mail. Einband bestoßen, daher Mängelexemplar gestempelt, sonst sehr guter Zustand. Imperfect copy due to slightly bumped cover, apart from this in very good condition. Stamped. Stamped. Sprache: Englisch. Nº de ref. del artículo: 208BB
Gastos de envío:
EUR 30,00
De Alemania a Estados Unidos de America
Destinos, gastos y plazos de envío
Cantidad disponible: 1 disponibles
Imagen de archivo
Process Variations and Probabilistic Integrated Circuit Design (eng)
Impresión bajo demandaLibrería: Brook Bookstore On Demand, Napoli, NA, Italia
Calificación del vendedor: 5 de 5 estrellas
Condición: new. Questo è un articolo print on demand. Nº de ref. del artículo: 255f89863cbc5589ef6ed1a5a667a76d
Cantidad disponible: Más de 20 disponibles
Imagen del vendedor
Process Variations and Probabilistic Integrated Circuit Design
Impresión bajo demandaLibrería: moluna, Greven, Alemania
Calificación del vendedor: 4 de 5 estrellas
Gebunden. Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Trains IC designers to recognize problems caused by parameter variations during manufacturing and to choose the best methods available to mitigate these issues during the design process Offers both qualitative and quantitative insight into critical effects . Nº de ref. del artículo: 4176116
Gastos de envío:
EUR 48,99
De Alemania a Estados Unidos de America
Destinos, gastos y plazos de envío
Cantidad disponible: Más de 20 disponibles
Imagen de archivo
Process Variations and Probabilistic Integrated Circuit Design
Librería: Lucky's Textbooks, Dallas, TX, Estados Unidos de America
Calificación del vendedor: 5 de 5 estrellas
Condición: New. Nº de ref. del artículo: ABLIING23Mar2411530297124
Cantidad disponible: Más de 20 disponibles
Imagen del vendedor
Process Variations and Probabilistic Integrated Circuit Design
Librería: GreatBookPrices, Columbia, MD, Estados Unidos de America
Calificación del vendedor: 5 de 5 estrellas
Condición: New. Nº de ref. del artículo: 11628941-n
Cantidad disponible: 15 disponibles
Imagen del vendedor
Process Variations and Probabilistic Integrated Circuit Design
Publicado por
Springer New York, Springer US Nov 2011, 2011
ISBN 10: 144196620X
ISBN 13: 9781441966209
Nuevo
Tapa dura
Librería: buchversandmimpf2000, Emtmannsberg, BAYE, Alemania
Calificación del vendedor: 5 de 5 estrellas
Buch. Condición: Neu. Neuware -Uncertainty in key parameters within a chip and between different chips in the deep sub micron area plays a more and more important role. As a result, manufacturing process spreads need to be considered during the design process. Quantitative methodology is needed to ensure faultless functionality, despite existing process variations within given bounds, during product development.This book presents the technological, physical, and mathematical fundamentals for a design paradigm shift, from a deterministic process to a probability-orientated design process for microelectronic circuits. Readers will learn to evaluate the different sources of variations in the design flow in order to establish different design variants, while applying appropriate methods and tools to evaluate and optimize their design.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 268 pp. Englisch. Nº de ref. del artículo: 9781441966209
Gastos de envío:
EUR 60,00
De Alemania a Estados Unidos de America
Destinos, gastos y plazos de envío
Cantidad disponible: 2 disponibles
Imagen del vendedor
Process Variations and Probabilistic Integrated Circuit Design
Publicado por
Springer New York, Springer US Nov 2011, 2011
ISBN 10: 144196620X
ISBN 13: 9781441966209
Nuevo
Tapa dura
Librería: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Alemania
Calificación del vendedor: 5 de 5 estrellas
Buch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Uncertainty in key parameters within a chip and between different chips in the deep sub micron area plays a more and more important role. As a result, manufacturing process spreads need to be considered during the design process. Quantitative methodology is needed to ensure faultless functionality, despite existing process variations within given bounds, during product development.This book presents the technological, physical, and mathematical fundamentals for a design paradigm shift, from a deterministic process to a probability-orientated design process for microelectronic circuits. Readers will learn to evaluate the different sources of variations in the design flow in order to establish different design variants, while applying appropriate methods and tools to evaluate and optimize their design. 268 pp. Englisch. Nº de ref. del artículo: 9781441966209
Gastos de envío:
EUR 23,00
De Alemania a Estados Unidos de America
Destinos, gastos y plazos de envío
Cantidad disponible: 2 disponibles
Imagen del vendedor
Process Variations and Probabilistic Integrated Circuit Design
Publicado por
Springer New York, Springer US, 2011
ISBN 10: 144196620X
ISBN 13: 9781441966209
Nuevo
Tapa dura
Librería: AHA-BUCH GmbH, Einbeck, Alemania
Calificación del vendedor: 5 de 5 estrellas
Buch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - Uncertainty in key parameters within a chip and between different chips in the deep sub micron area plays a more and more important role. As a result, manufacturing process spreads need to be considered during the design process. Quantitative methodology is needed to ensure faultless functionality, despite existing process variations within given bounds, during product development.This book presents the technological, physical, and mathematical fundamentals for a design paradigm shift, from a deterministic process to a probability-orientated design process for microelectronic circuits. Readers will learn to evaluate the different sources of variations in the design flow in order to establish different design variants, while applying appropriate methods and tools to evaluate and optimize their design. Nº de ref. del artículo: 9781441966209
Gastos de envío:
EUR 62,86
De Alemania a Estados Unidos de America
Destinos, gastos y plazos de envío
Cantidad disponible: 1 disponibles
Imagen de archivo
Process Variations and Probabilistic Integrated Circuit Design (Hardcover)
Publicado por
Springer-Verlag New York Inc., New York, NY, 2011
ISBN 10: 144196620X
ISBN 13: 9781441966209
Nuevo
Tapa dura
Librería: Grand Eagle Retail, Bensenville, IL, Estados Unidos de America
Calificación del vendedor: 5 de 5 estrellas
Hardcover. Condición: new. Hardcover. Uncertainty in key parameters within a chip and between different chips in the deep sub micron area plays a more and more important role. As a result, manufacturing process spreads need to be considered during the design process. Quantitative methodology is needed to ensure faultless functionality, despite existing process variations within given bounds, during product development.This book presents the technological, physical, and mathematical fundamentals for a design paradigm shift, from a deterministic process to a probability-orientated design process for microelectronic circuits. Readers will learn to evaluate the different sources of variations in the design flow in order to establish different design variants, while applying appropriate methods and tools to evaluate and optimize their design. Readers will learn to evaluate the different sources of variations in the design flow in order to establish different design variants, while applying appropriate methods and tools to evaluate and optimize their design. Shipping may be from multiple locations in the US or from the UK, depending on stock availability. Nº de ref. del artículo: 9781441966209
Cantidad disponible: 1 disponibles
Imagen de archivo
Process Variations and Probabilistic Integrated Circuit Design
Librería: Books Puddle, New York, NY, Estados Unidos de America
Calificación del vendedor: 4 de 5 estrellas
Condición: New. pp. 268. Nº de ref. del artículo: 262060684
Cantidad disponible: 4 disponibles