570 pages; B&W illustrations. Rubbing and stains to the back cover. Creasing to spine. Light fading to pages. Dog-earing to a lot of pages. Good condition otherwise. No other noteworthy defects. No markings. ; - Your satisfaction is our priority. We offer free returns and respond promptly to all inquiries. Your item will be carefully cushioned in bubble wrap and securely boxed. All orders ship on the same or next business day. Buy with confidence.

N� de ref. del art�culo HVD-52380-OS-0

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Detalles bibliogr�ficos

T�tulo: Proceedings of Third International Conference on Very Large Data Bases Tokyo, Japan October 1977 - IEEE
Editor: Institute of Electrical and Electronics Engineers, Inc., New York, NY
Fecha de publicaci�n: 1977
Encuadernaci�n: Paperback
Edici�n: Serial Issue.
Estado: Good

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