T�tulo: Power-Constrained Testing of VLSI Circuits: A Guide to the IEEE 1149.4 Test Standard
Editor: Springer-Verlag New York Inc.
Fecha de publicaci�n: 2003
Idioma: Ingl�s
ISBN 10: 140207235X
ISBN 13: 9781402072352
Encuadernaci�n: Hardback
Estado: New

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Sinopsis

This text focuses on techniques for minimizing power dissipation during test application at logic and register-transfer levels of abstraction of the VLSI design flow. It surveys existing techniques and presents several test automation techniques for reducing power in scan-based sequential circuits and BIST data paths.

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