Next Generation HALT and HASS

Idioma: inglés

Editorial: John Wiley and Sons Inc, US, 2016

1118700236 / 9781118700235

Serie: Libro 8 de 19 - Quality and Reliability Engineering

Librería: Rarewaves.com UK, London, Reino UnidoRarewaves.com UK

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Descripción del artículo del vendedor

NEXT GENERATION HALT AND HASS ROBUST DESIGN OF ELECTRONICS AND SYSTEMS A NEW APPROACH TO DISCOVERING AND CORRECTING SYSTEMS RELIABILITY RISKS Next Generation HALT and HASS presents a major paradigm shift from reliability prediction-based methods to discovery of electronic systems reliability risks. This is achieved by integrating highly accelerated life test (HALT) and highly accelerated stress screen (HASS) into a physics of failure based robust product and process development methodology. The new methodologies challenge misleading and sometimes costly misapplication of probabilistic failure prediction methods (FPM) and provide a new deterministic map for reliability development. The authors clearly explain the new approach with a logical progression of problem statement and solutions. The book helps engineers employ HALT and HASS by demonstrating why the misleading assumptions used for FPM are invalid. Next, the application of HALT and HASS empirical discovery methods to quickly find unreliable elements in electronics systems gives readers practical insight into the techniques. The physics of HALT and HASS methodologies are highlighted, illustrating how they uncover and isolate software failures due to hardware-software interactions in digital systems. The use of empirical operational stress limits for the development of future tools and reliability discriminators is described. Key features: Provides a clear basis for moving from statistical reliability prediction models to practical methods of insuring and improving reliability.Challenges existing failure prediction methodologies by highlighting their limitations using real field data.Explains a practical approach to why and how HALT and HASS are applied to electronics and electromechanical systems.Presents opportunities to develop reliability test discriminators for prognostics using empirical stress limits.Guides engineers and managers on the benefits of the deterministic and more efficient methods of HALT and HASS.Integrates the empirical limit discovery methods of HALT and HASS into a physics of failure based robust product and process development process.…

N° de ref. del artículo LU-9781118700235

Título
Next Generation HALT and HASS
Autor
Kirk A. Gray, John J. Paschkewitz
Editorial
John Wiley and Sons Inc, US
Año de publicación
2016
Estado
New
Encuadernación
Hardback
Idioma
inglés
ISBN 10
1118700236
ISBN 13
9781118700235
Peso del artículo
550 gramos
Serie
Libro 8 de 19: Quality and Reliability Engineering

Rarewaves.com UK

London, Reino Unido

Vendedor de 5 estrellas

Vendedor de AbeBooks desde el 11 de junio de 2025

Tarifas de envío de Reino Unido a Estados Unidos de America

ArtículoDe 60 a 60 días hábilesDe 60 a 60 días hábiles
Primer artículoEUR 75,77EUR 116,56
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