This item is printed on demand - it takes 3-4 days longer - Neuware -Over the past decade, low power, energy efficient Very Large Scale Integration design has been the focal point for active research and development. The rapid technology scaling, growing integration capacity and leakage power dissipation are the contributing factors for increas in the complexity of modern VLSI design. Voltage scaling is one of the most efficient ways for reducing power and energy in VLSI circuitry. Due to the reduced threshold voltage, switching speed becomes faster, active leakage current is increased. A technique to dynamically manage active leakage current, which reduces the energy dissipation in VLSI circuitry at different circuits with different levels of complexity is required. As technology scale into the deep sub micron technology regime, sub threshold leakage power increases exponentially with the reduction of the threshold voltage. Therefore effective leakage and dynamic power minimization techniques become necessary. Ground, power and hybrid gated techniques are proposed as effective circuit level techniques that get better performance, low leakage and low dynamic power. The design and performance evaluation of 1-bi. 236 pp. Englisch.

N� de ref. del art�culo 9786202672290

Contactar al vendedor

Denunciar este art�culo

Detalles bibliogr�ficos

T�tulo: Minimization of Dynamic Power Through Structural Changes &Vt Techniques
Editor: LAP LAMBERT Academic Publishing Jun 2020
Fecha de publicaci�n: 2020
Idioma: Ingl�s
ISBN 10: 6202672293
ISBN 13: 9786202672290
Encuadernaci�n: Taschenbuch
Estado: Neu

Acerca de

Sinopsis

Over the past decade, low power, energy efficient Very Large Scale Integration design has been the focal point for active research and development. The rapid technology scaling, growing integration capacity and leakage power dissipation are the contributing factors for increas in the complexity of modern VLSI design. Voltage scaling is one of the most efficient ways for reducing power and energy in VLSI circuitry. Due to the reduced threshold voltage, switching speed becomes faster, active leakage current is increased. A technique to dynamically manage active leakage current, which reduces the energy dissipation in VLSI circuitry at different circuits with different levels of complexity is required. As technology scale into the deep sub micron technology regime, sub threshold leakage power increases exponentially with the reduction of the threshold voltage. Therefore effective leakage and dynamic power minimization techniques become necessary. Ground, power and hybrid gated techniques are proposed as effective circuit level techniques that get better performance, low leakage and low dynamic power. The design and performance evaluation of 1-bi.

"Sobre este t�tulo" puede pertenecer a otra edici�n de este libro.

Descripci�n de la librer�a

Ver la p�gina web de la librer�a

Informaci�n empresarial del vendedor

BuchWeltWeit Ludwig Meier e.K.
Germany

Condiciones de venta y env�o

Condiciones de venta

???????????????????????????????????????????????????????
Allgemeine Gesch�ftsbedingungen mit Kundeninformationen
???????????????????????????????????????????????????????

Inhaltsverzeichnis
??????????????????