Investigation of Radiation Effects on Semiconductor Devices and Integrated Circuits; DNA-TR-88-2

Editorial: Northrop Corporation, Palos Verdes Peninsula, CA, 1988

Vendedor patrimonial

Librería: Ground Zero Books, Ltd., Silver Spring, MD, Estados Unidos de AmericaGround Zero Books, Ltd.

Vendedor de 5 estrellas

Vendedor de IberLibro desde 14 de agosto de 1998

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Descripción del artículo del vendedor

This was prepared for the Director, Defense Nuclear Agency under Contract NO. DNA 001-84-C-0196. It was approved for public release. DD Form 1473 lists the page count as 162. Illustrations. References. Cover has some wear. Some illustrations appear degraded from what would have appeared in the original publication. Results of a study of radiation effects on electronic materials, devices, and integrated circuits are presented in this report. Emphasis was placed on determining the underlying mechanisms responsible for observed radiation effects with a view toward gaining understanding of value in the development of radiation-hardened devices. Measurements and analyses were performed of the effects of single energetic neutrons and protons on silicon integrated circuits. This is a detailed description is given of the effects of radiation-induced displacement damage on device depletion regions. Single event upset studies included charge collection and transient current measurements on Si and GaAs devices following a single alpha-particle strike. The angular dependence of charge funneling was also investigated. The mechanisms of ionizing radiation effects on Si MOS devices were explored in detail using the thermally stimulated current technique and other measurement approaches. Data obtained by several techniques show that use of the radiation-induced shift of the capacitance-voltage curve at midgap is not generally valid for determining oxide trapped charge.…

N° de ref. del artículo 76165

Detalles bibliográficos

Título
Investigation of Radiation Effects on Semiconductor Devices and Integrated Circuits; DNA-TR-88-2
Autor
Shanfield, Zef and, Srour, Joseph R., Moriwaki, Melvin and, Kerry, S. and Hartmann, Robert
Editorial
Northrop Corporation, Palos Verdes Peninsula, CA
Año de publicación
1988
Estado
Good
Encuadernación
Staplebound
Edición
DTIC reprint.

Ground Zero Books, Ltd.

Silver Spring, MD, Estados Unidos de America

Vendedor de 5 estrellas

Vendedor de IberLibro desde 14 de agosto de 1998

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Founded and operated by trained historians, Ground Zero Books, Ltd., serves the book collector, the scholar, and institutions. We focus on the individual, and pride ourselves on our personal service. Please contact us with your wants, as we have many books not yet listed in our database.

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Ground Zero Books, Ltd.

9033 Georgia Avenue
Silver Spring, MD Estados Unidos de America 20910-2254