Hardcover. An Introduction to the Fundamentals and History of Control Charts, Applications, and Guidelines for Implementation Introduction to Statistical Process Control examines various types of control charts that are typically used by engineering students and practitioners. This book helps readers develop a better understanding of the history, implementation, and use-cases. Students are presented with varying control chart techniques, information, and roadmaps to ensure their control charts are operating efficiently and producing specification-confirming products. This is the essential text on the theories and applications behind statistical methods and control procedures. This eight-chapter reference breaks information down into digestible sections and covers topics including: An introduction to the basics as well as a background of control charts Widely used and newly researched attributes of control charts, including guidelines for implementation The process capability index for both normal and non-normal distribution via the sampling of multiple dependent states An overview of attribute control charts based on memory statistics The development of control charts using EQMA statistics For a solid understanding of control methodologies and the basics of quality assurance, Introduction to Statistical Process Control is a definitive reference designed to be read by practitioners and students alike. It is an essential textbook for those who want to explore quality control and systems design. Shipping may be from multiple locations in the US or from the UK, depending on stock availability. N� de ref. del art�culo 9781119528456

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T�tulo: Introduction to Statistical Process Control ...

Editorial: John Wiley & Sons Inc, New York

A�o de publicaci�n: 2020

Encuadernaci�n: Hardcover

Condici�n: new

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An Introduction to the Fundamentals and History of Control Charts, Applications, and Guidelines for Implementation

Introduction to Statistical Process Control examines various types of control charts that are typically used by engineering students and practitioners. This book helps readers develop a better understanding of the history, implementation, and use-cases. Students are presented with varying control chart techniques, information, and roadmaps to ensure their control charts are operating efficiently and producing specification-confirming products. This is the essential text on the theories and applications behind statistical methods and control procedures.

This eight-chapter reference breaks information down into digestible sections and covers topics including:

● An introduction to the basics as well as a background of control charts

● Widely used and newly researched attributes of control charts, including guidelines for implementation

● The process capability index for both normal and non-normal distribution via the sampling of multiple dependent states

● An overview of attribute control charts based on memory statistics

● The development of control charts using EQMA statistics

For a solid understanding of control methodologies and the basics of quality assurance, Introduction to Statistical Process Control is a definitive reference designed to be read by practitioners and students alike. It is an essential textbook for those who want to explore quality control and systems design.

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MUHAMMAD ASLAM, Ph.D., is a Professor in the Department of Statistics at King Abdulaziz University at Jeddah, Saudi Arabia. He was awarded the "Research Productivity Award for the year" in 2012 by Pakistan Council for Science and Technology. He is the founder of neutrosophic statistical quality control and neutrosophic inferential statistics.

AAMIR SAGHIR, Ph.D., is a Professor in the Department of Mathematics at Mirpur University of Science and Technology. He received his Ph.D. in Statistics from Zhejiang University in China.

LIAQUAT AHMAD, Ph.D., is an Associate Professor in the Department of Statistics and Computer Science at the University of Veterinary and Animal Sciences, Lahore, Pakistan. He's taught Statistics for over 24 years at the Ph.D. and M. Phil levels.

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