Introduction to Scanning Tunneling Microscopy Third Edition (Hardcover)

C. Julian Chen

6 valoraciones de Goodreads

Idioma: inglés

Editorial: Oxford University Press, Oxford, 2021

0198856555 / 9780198856559

Serie: Libro 11 de 11 - Monographs on the Physics and Chemistry of Materials

Librería: Grand Eagle Retail, Bensenville, IL, Estados Unidos de AmericaGrand Eagle Retail

Vendedor de 5 estrellas

Vendedor de IberLibro desde 12 de octubre de 2005

Tapa dura

Condición: Nuevo

EUR 167,05

 Gastos de envío gratis 
Se envía dentro de Estados Unidos de America

Cantidad disponible: 1 disponible

Añadir al carrito
Devoluciones gratuitas de 30 días

Descripción del artículo del vendedor

Hardcover. The scanning tunnelling microscope (STM) was invented by Binnig and Rohrer and received a Nobel Prize of Physics in 1986. Together with the atomic force microscope (AFM), it provides non-destructive atomic and subatomic resolution on surfaces. Especially, in recent years, internal details of atomic and molecular wavefunctions are observed and mapped with negligible disturbance. Since the publication of its first edition, this book has been the standard referencebook and a graduate-level textbook educating several generations of nano-scientists. In Aug. 1992, the co-inventor of STM, Nobelist Heinrich Rohrer recommended: "The Introduction to Scanning tunnellingMicroscopy by C.J. Chen provides a good introduction to the field for newcomers and it also contains valuable material and hints for the experts". For the second edition, a 2017 book review published in the Journal of Applied Crystallography said "Introduction to Scanning tunnelling Microscopy is an excellent book that can serve as a standard introduction for everyone that starts working with scanning probe microscopes, and a useful reference book for those more advanced in the field". Thethird edition is a thoroughly updated and improved version of the recognized "Bible" of the field.Additions to the third edition include: theory, method, results, andinterpretations of the non-destructive observation and mapping of atomic and molecular wavefunctions; elementary theory and new verifications of equivalence of chemical bond interaction and tunnelling; scanning tunnelling spectroscopy of high Tc superconductors; imaging of self-assembled organic molecules on the solid-liquid interfaces. Some key derivations are rewritten using mathematics at an undergraduate level to make it pedagogically sound. This third edition is a thoroughly updated and improved version of the recognized "Bible" of the field. This item is printed on demand. Shipping may be from multiple locations in the US or from the UK, depending on stock availability.…

N° de ref. del artículo 9780198856559

Título
Introduction to Scanning Tunneling Microscopy Third Edition (Hardcover)
Autor
C. Julian Chen
Editorial
Oxford University Press, Oxford
Año de publicación
2021
Estado
new
Encuadernación
Hardcover
Idioma
inglés
ISBN 10
0198856555
ISBN 13
9780198856559
Edición
3ª Edición
Serie
Libro 11 de 11: Monographs on the Physics and Chemistry of Materials

Grand Eagle Retail

Bensenville, IL, Estados Unidos de America

Vendedor de 5 estrellas

Vendedor de IberLibro desde 12 de octubre de 2005

Tarifas de envío en Estados Unidos de America

ArtículoDe 6 a 14 días hábilesDe 6 a 16 días hábiles
Primer artículoEUR 0,00EUR 0,00
Los plazos de entrega los establecen los vendedores y varían según el transportista y la ubicación. Los pedidos que pasan por la aduana pueden sufrir retrasos y los compradores son responsables de los aranceles o tarifas asociadas. Los vendedores pueden ponerse en contacto con usted en relación con cargos adicionales para cubrir cualquier aumento en los costes de envío de los artículos.

Métodos de pago

  • Visa
  • Mastercard
  • American Express
  • Carte Bleue
  • Apple Pay
  • Google Pay

Información empresarial del vendedor

APOLLO ONLINE CORP.

605 Geddes Street
Wilmington, DE Estados Unidos de America 19805