Pages are New and Unused, Front or Back cover is damaged- torn, wrinkled or dented., Used Like New, no missing pages, no damage to binding, may have a remainder mark.

N� de ref. del art�culo ABS-1333-1574

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Detalles bibliogr�ficos

T�tulo

An Introduction to Mixed-Signal IC Test and Measurement (The Oxford Series in Electrical and Computer Engineering)

Editor

Oxford University Press

Encuadernaci�n

hardcover

Estado

LikeNew

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Academic Book Solutions
70-6 Peconic Avenue, Medford, NY, 11763, U.S.A.

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