An Intro to Surface Analysis by XPS/AES. Este artículo no está disponible.
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Idioma: inglés
Editorial: John Wiley &Sons, 2003
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- Usado
Librería: WorldofBooks, Goring-By-Sea, WS, Reino UnidoWorldofBooks
Vendedor de 5 estrellas
Vendedor de IberLibro desde 16 de marzo de 2007
No disponible
Tapa blanda
Condición: Usado - Bueno
EUR 3,54
Descripción del artículo del vendedor
The book has been read, but is in excellent condition. Pages are intact and not marred by notes or highlighting. The spine remains undamaged.
N° de ref. del artículo GOR008537474
- Título
- An Intro to Surface Analysis by XPS/AES
- Autor
- Watts, John F.
- Editorial
- John Wiley &Sons
- Año de publicación
- 2003
- Estado
- Very Good
- Encuadernación
- Paperback
- Idioma
- inglés
- ISBN 10
- 0470847131
- ISBN 13
- 9780470847138
- Edición
- 2ª Edición
- Peso del artículo
- 422 gramos
Extensively revised and updated with additional material included in existing chapters and new material on angle resolved XPS, surface engineering and complimentary methods.
* Includes an accessible introduction to the key spectroscopic techniques in surface analysis.
* Provides descriptions of latest instruments and techniques.
* Includes a detailed glossary of key surface analysis terms.
* Includes an accessible introduction to the key spectroscopic techniques in surface analysis.
* Provides descriptions of latest instruments and techniques.
* Includes a detailed glossary of key surface analysis terms.
“Sinopsis” puede pertenecer a otra edición de este título.
Acerca del autor
John F Watts is Professor of Adhesion Science in the School of Engineering at the Unversity Surrey. He currently leads a Research Group applying surface analysis methods to investigations in materials science and is Editor-in-Chief of the Wiley journal Surface and Interface Analysis.
John Wolstenholme is Marketing Manager at Thermo VG Scientific. With a background in SIMS, he has been actively involved in XPS and AES for the last twelve years.
“Acerca de” puede pertenecer a otra edición de este título.