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Ria Christie Collections, Uxbridge, Reino Unido
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Vendedor de AbeBooks desde 25 de marzo de 2015
In. N° de ref. del artículo ria9780780334472_new
"INTEGRATED CIRCUIT MANUFACTURABILITY provides comprehensive coverage of the process and design variables that determine the ease and feasibility of fabrication (or manufacturability) of contemporary VLSI systems and circuits. This book progresses from semiconductor processing to electrical design to system architecture. The material provides a theoretical background as well as case studies, examining the entire design for the manufacturing path from circuit to silicon. Each chapter includes tutorial and practical applications coverage.
INTEGRATED CIRCUIT MANUFACTURABILITY illustrates the implications of manufacturability at every level of abstraction, including the effects of defects on the layout, their mapping to electrical faults, and the corresponding approaches to detect such faults. The reader will be introduced to key practical issues normally applied in industry and usually required by quality, product, and design engineering departments in today's design practices:
* Yield management strategies
* Effects of spot defects
* Inductive fault analysis and testing
* Fault-tolerant architectures and MCM testing strategies.
This book will serve design and product engineers both from academia and industry. It can also be used as a reference or textbook for introductory graduate-level courses on manufacturing."
Acerca del autor:
About the Editors...
Jose Pineda de Gyvez is an associate professor in the Department of Electrical Engineering, holding a joint faculty appointment with the Department of Computer Science, at Texas A&M University. Dr. Pineda de Gyvez was associate editor of technology for IEEE Transactions on Semiconductor Manufacturing and associate editor for cellular neural networks for IEEE Transactions on Circuits and Systems: Part 1.
Dhiraj K. Pradhan is currently a visiting professor with the Department of Electrical Engineering at Stanford University (on leave from Texas A&M University.) Prior to joining Texas A&M, he served as professor and coordinator of computer engineering at the University of Massachusetts. Dr. Pradhan has contributed to VLSI CAD and test fault-tolerant computing, computer architecture, and parallel processing research with major publications in journals and conferences over the last 25 years.
Título: Integrated Circuit Manufacturability: The ...
Editorial: Wiley-IEEE Press
Año de publicación: 1998
Encuadernación: Encuadernación de tapa dura
Condición: New
Librería: Anybook.com, Lincoln, Reino Unido
Condición: Good. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. In good all round condition. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,900grams, ISBN:9780780334472. Nº de ref. del artículo: 5970171
Cantidad disponible: 1 disponibles
Librería: Buchpark, Trebbin, Alemania
Condición: Gut. Zustand: Gut | Sprache: Englisch | Produktart: Bücher. Nº de ref. del artículo: 2572268/3
Cantidad disponible: 1 disponibles
Librería: Basi6 International, Irving, TX, Estados Unidos de America
Condición: Brand New. New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service. Nº de ref. del artículo: ABEOCT25-116227
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Librería: GoldBooks, Denver, CO, Estados Unidos de America
Condición: new. Nº de ref. del artículo: 16D43_58_0780334477
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Librería: ALLBOOKS1, Direk, SA, Australia
Brand new book. Fast ship. Please provide full street address as we are not able to ship to P O box address. Nº de ref. del artículo: SHAK116227
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Librería: Books Puddle, New York, NY, Estados Unidos de America
Condición: New. pp. 332. Nº de ref. del artículo: 26376293
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Librería: Majestic Books, Hounslow, Reino Unido
Condición: New. pp. 332. Nº de ref. del artículo: 7471674
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Librería: moluna, Greven, Alemania
Condición: New. Über den AutorAbout the Editors.Jose Pineda de Gyvez is an associate professor in the Department of Electrical Engineering, holding a joint faculty appointment with the Department of Computer Science, at Texas A&M University. . Nº de ref. del artículo: 594985994
Cantidad disponible: 1 disponibles
Librería: PBShop.store UK, Fairford, GLOS, Reino Unido
HRD. Condición: New. New Book. Shipped from UK. Established seller since 2000. Nº de ref. del artículo: FW-9780780334472
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Librería: CitiRetail, Stevenage, Reino Unido
Hardcover. Condición: new. Hardcover. "INTEGRATED CIRCUIT MANUFACTURABILITY provides comprehensive coverage of the process and design variables that determine the ease and feasibility of fabrication (or manufacturability) of contemporary VLSI systems and circuits. This book progresses from semiconductor processing to electrical design to system architecture. The material provides a theoretical background as well as case studies, examining the entire design for the manufacturing path from circuit to silicon. Each chapter includes tutorial and practical applications coverage. INTEGRATED CIRCUIT MANUFACTURABILITY illustrates the implications of manufacturability at every level of abstraction, including the effects of defects on the layout, their mapping to electrical faults, and the corresponding approaches to detect such faults. The reader will be introduced to key practical issues normally applied in industry and usually required by quality, product, and design engineering departments in today's design practices: * Yield management strategies * Effects of spot defects * Inductive fault analysis and testing * Fault-tolerant architectures and MCM testing strategies. This book will serve design and product engineers both from academia and industry. It can also be used as a reference or textbook for introductory graduate-level courses on manufacturing." This text addresses the study of process and design variables to determine the ease and feasibility of fabrication - or manufacturability - of contemporary VLSI systems and circuits. Shipping may be from our UK warehouse or from our Australian or US warehouses, depending on stock availability. Nº de ref. del artículo: 9780780334472
Cantidad disponible: 1 disponibles