High-power Radio Frequency Effects on Electronic Systems. Este artículo no está disponible.
Idioma: inglés
Editorial: Artech House, 2020
- Tapa dura
- Nuevo

Librería: Revaluation Books, Exeter, Reino UnidoRevaluation Books
Vendedor de IberLibro desde 6 de enero de 2003
Condición: Nuevo
EUR 154,63
Descripción del artículo del vendedor
320 pages. 9.25x6.25x1.00 inches. In Stock.
N° de ref. del artículo __1630815888
- Título
- High-power Radio Frequency Effects on Electronic Systems
- Autor
- Giri, D. V./ Sabath, Frank/ Hoad, Richard
- Editorial
- Artech House
- Año de publicación
- 2020
- Estado
- Brand New
- Encuadernación
- Hardcover
- Idioma
- inglés
- ISBN 10
- 1630815888
- ISBN 13
- 9781630815882
- Peso del artículo
- 0,66 kilogramos
This is the first book that comprehensively addresses the issues relating to the effects of radio frequency (RF) signals and the environment of electrical and electronic systems. It covers testing methods as well as methods to analyze radio frequency. The generation of high-powered electromagnetic (HPEM) environments, including moderate band damped sinusoidal radiators and hyperband radiating systems is explored. HPEM effects on component, circuit, sub-system electronics, as well as system level drawing are discussed. The effects of HPEM on experimental techniques and the standards which can be used to control tests are described. The validity of analytical techniques and computational modeling in a HPEM effects context is also discussed.
Insight on HPEM effects experimental techniques and the standards which can be used to control tests is provided, and the validity of analytical techniques and computational modeling in a HPEM effects context is discussed. This book dispels myths, clarifies good experimental practice and ultimately draws conclusions on the HPEM interaction with electronics. Readers will learn to consider the importance of HPEM phenomena as a threat to modern electronic based technologies which underpin society and to therefore be pre-emptive in the consideration of HPEM resilience.
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