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A working tool that delivers expert guidance on all aspects of product reliability

The completely updated second edition of this classic reference offers you unsurpassed coverage of all aspects of reliability engineering and management, including reliability issues in electronic components and systems, software, and mechanical devices. It now includes specific information on how to design a product for reliability; it adds the concept of process and the tools of total quality control (TQC) to the reliability function. Filled with applications ranging from consumer products to high-tech systems, this indispensable handbook clearly demonstrates how reliability is a process that can be characterized, controlled, and improved. It provides you with a wealth of new material on the reliability function, as well as highly effective methods and mathematics used to predict and determine the reliability of a product.

You'll find practical information on proven industry practices to define and achieve reliability goals, as well as the traditional mathematics of reliability. Also included are basic tables for determining reliability, and standards and specifications used b the U.S. Department of Defense. Essential for all reliability engineers, product designers, quality engineers, and engineering mathematics, this edition of the world-renowned handbook will give you the expertise needed to define and attain optimum reliability goals for your company's products.

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McGraw-Hill authors represent the leading experts in their fields and are dedicated to improving the lives, careers, and interests of readers worldwide

Clyde F. Coombs, Jr, (Los Altos, CA) recently retired from Hewlett-Packard. He is the editor of all five editions of the Printed Circuits Handbook, the first of which was published in 1967. He is also the editor of two editions of the Electronics Instrument Handbook and the communications Network Test and Measurement Handbook.

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Handbook of Reliability Engineering and Management 2/E

Ireson, W. Grant; Coombs, Clyde F.; Moss, Richard Y.

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