Handbook of Practical X-Ray Fluorescence Analysis

. Ed(s): Beckhoff, Burkhard; Kanngiesser, Birgit; Langhoff, Norbert; Wedell, Reiner; Wolff, Helmut H. (University of Lubeck)

ISBN 10: 3662496011 ISBN 13: 9783662496015
Editorial: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG, 2006
Nuevos Encuadernación de tapa blanda

Librería: Kennys Bookshop and Art Galleries Ltd., Galway, GY, Irlanda Calificación del vendedor: 5 de 5 estrellas Valoración 5 estrellas, Más información sobre las valoraciones de los vendedores

Vendedor de AbeBooks desde 27 de febrero de 2001

Este artículo en concreto ya no está disponible.

Descripción

Descripción:

Editor(s): Beckhoff, Burkhard; Kanngiesser, Birgit; Langhoff, Norbert; Wedell, Reiner; Wolff, Helmut H. (University of Lubeck). Num Pages: 878 pages, 53 black & white tables, biography. BIC Classification: PHF; PNF; PNFS; TGMT. Category: (G) General (US: Trade). Dimension: 235 x 155 x 45. Weight in Grams: 1242. . 2006. Paperback. . . . . N° de ref. del artículo V9783662496015

Denunciar este artículo

Sinopsis:

X-Ray fluorescence analysis is an established technique for non-destructive elemental materials analysis. This book gives a user-oriented practical guidance to the application of this method. The book gives a survey of the theoretical fundamentals, analytical instrumentation, software for data processing, various excitation regimes including gracing incidents and microfocus measurements, quantitative analysis, applications in routine and micro analysis, mineralogy, biology, medicine, criminal investigations, archeology, metallurgy, abrasion, microelectronics, environmental air and water analysis. This book is the bible of X-Ray fluorescence analysis. It gives the basic knowledge on this technique, information on analytical equipment and guides the reader to the various applications. It appeals to researchers, analytically active engineers and advanced students.

De la contraportada:

X-Ray Fluorescence analysis (XRF) is a reliable multi-elemental and nondestructive analytical method widely used in research and industrial applications. This practical handbook provides self-contained modules featuring XRF instrumentation, quantification methods, and most of the current applications. The broad spectrum of topics is due to the efforts of a large number of authors from a variety of different types of institutions such as universities, research institutes, and companies.  The book gives a survey of the theoretical fundamentals, analytical instrumentation, software for data processing, various excitation regimes including gracing incidents and microfocus measurements, quantitative analysis, applications in routine and micro analysis, mineralogy, biology, medicine, criminal investigations, archeology, metallurgy, abrasion, microelectronics, environmental air and water analysis. It gives the basic knowledge on this technique, information on analytical equipment and guides the reader to the various applications. This practical handbook is intended as a resource for graduate students, research scientists, and industrial users

"Sobre este título" puede pertenecer a otra edición de este libro.

Detalles bibliográficos

Título: Handbook of Practical X-Ray Fluorescence ...
Editorial: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
Año de publicación: 2006
Encuadernación: Encuadernación de tapa blanda
Condición: New

Los mejores resultados en AbeBooks

Imagen de archivo

Unbekannt
Publicado por Springer, 2006
ISBN 10: 3662496011 ISBN 13: 9783662496015
Antiguo o usado Tapa blanda

Librería: Buchpark, Trebbin, Alemania

Calificación del vendedor: 5 de 5 estrellas Valoración 5 estrellas, Más información sobre las valoraciones de los vendedores

Condición: Hervorragend. Zustand: Hervorragend | Seiten: 904 | Sprache: Englisch | Produktart: Bücher | X-Ray ?uorescence analysis (XRF) has developed into a well-established multi-elemental analysis technique with a very wide ?eld of practical app- cations, especially those requiring nondestructive analytical methods. Over a long period of time, steady progress of XRF was made, both methodological and instrumental. Within the last decade, however, advancements in te- nology, software development, and methodologies for quanti?cation have p- vided an impetus to XRF research and application, leading to striking new improvements. The recent technological advances, including table-top inst- ments that take advantage of novel low-power micro-focus tubes, novel X-ray optics and detectors, as well as simpli?ed access to synchrotron radiation, have made it possible to extend XRF to low Z elements and to obtain t- and three-dimensional information from a sample on a micrometer-scale. The development of portable and hand-held devices has enabled a more ?exible use of XRF in a variety of new situations, such as archaeometry and process control. Furthermore, synchrotron radiation provides high excitation ?ux and even speciation capabilities due to energetically tunable radiation. Because of these recent advancements, the editors decided to compile a practicalhandbookofXRFasaresourceforscientistsandindustrialusersthat providesenoughinformationtoconceiveandsetupmodernXRFexperiments foruseinawiderangeofpracticalapplications. Additionally,selectedsections consist of a concise summary of background information for readers who wish to gain a more in-depth understanding of the topics without conducting a lengthy search of the literature. The present handbook is not intended to be a textbook with interdependent chapters, rather a reference in which the information in each sectionis largely self-contained. Nº de ref. del artículo: 29515687/1

Contactar al vendedor

Comprar usado

EUR 436,27
Envío por EUR 105,00
Se envía de Alemania a Estados Unidos de America

Cantidad disponible: 1 disponibles

Añadir al carrito

Imagen del vendedor

Beckhoff, Burkhard|Kanngießer, Birgit|Langhoff, Norbert|Wedell, Reiner|Wolff, Helmut
Publicado por Springer Berlin Heidelberg, 2006
ISBN 10: 3662496011 ISBN 13: 9783662496015
Nuevo Tapa blanda
Impresión bajo demanda

Librería: moluna, Greven, Alemania

Calificación del vendedor: 4 de 5 estrellas Valoración 4 estrellas, Más información sobre las valoraciones de los vendedores

Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. The most comprehensive and latest&nbspcore reference&nbspin this field Makes it a must for all the analytical laboratories and individual analysts because of its user orientation The most comprehensive and latest core reference in thi. Nº de ref. del artículo: 449136963

Contactar al vendedor

Comprar nuevo

EUR 619,04
Envío por EUR 48,99
Se envía de Alemania a Estados Unidos de America

Cantidad disponible: Más de 20 disponibles

Añadir al carrito

Imagen de archivo

Publicado por Springer, 2006
ISBN 10: 3662496011 ISBN 13: 9783662496015
Nuevo Tapa blanda

Librería: Ria Christie Collections, Uxbridge, Reino Unido

Calificación del vendedor: 5 de 5 estrellas Valoración 5 estrellas, Más información sobre las valoraciones de los vendedores

Condición: New. In. Nº de ref. del artículo: ria9783662496015_new

Contactar al vendedor

Comprar nuevo

EUR 656,30
Envío por EUR 13,77
Se envía de Reino Unido a Estados Unidos de America

Cantidad disponible: Más de 20 disponibles

Añadir al carrito

Imagen del vendedor

Burkhard Beckhoff
ISBN 10: 3662496011 ISBN 13: 9783662496015
Nuevo Taschenbuch

Librería: buchversandmimpf2000, Emtmannsberg, BAYE, Alemania

Calificación del vendedor: 5 de 5 estrellas Valoración 5 estrellas, Más información sobre las valoraciones de los vendedores

Taschenbuch. Condición: Neu. Neuware -X-Ray uorescence analysis (XRF) has developed into a well-established multi-elemental analysis technique with a very wide eld of practical app- cations, especially those requiring nondestructive analytical methods. Over a long period of time, steady progress of XRF was made, both methodological and instrumental. Within the last decade, however, advancements in te- nology, software development, and methodologies for quanti cation have p- vided an impetus to XRF research and application, leading to striking new improvements. The recent technological advances, including table-top inst- ments that take advantage of novel low-power micro-focus tubes, novel X-ray optics and detectors, as well as simpli ed access to synchrotron radiation, have made it possible to extend XRF to low Z elements and to obtain t- and three-dimensional information from a sample on a micrometer-scale. The development of portable and hand-held devices has enabled a more exible use of XRF in a variety of new situations, such as archaeometry and process control. Furthermore, synchrotron radiation provides high excitation ux and even speciation capabilities due to energetically tunable radiation. Because of these recent advancements, the editors decided to compile a practicalhandbookofXRFasaresourceforscientistsandindustrialusersthat providesenoughinformationtoconceiveandsetupmodernXRFexperiments foruseinawiderangeofpracticalapplications. Additionally,selectedsections consist of a concise summary of background information for readers who wish to gain a more in-depth understanding of the topics without conducting a lengthy search of the literature. The present handbook is not intended to be a textbook with interdependent chapters, rather a reference in which the information in each sectionis largely self-contained.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 904 pp. Englisch. Nº de ref. del artículo: 9783662496015

Contactar al vendedor

Comprar nuevo

EUR 748,99
Envío por EUR 60,00
Se envía de Alemania a Estados Unidos de America

Cantidad disponible: 2 disponibles

Añadir al carrito

Imagen del vendedor

Burkhard Beckhoff
ISBN 10: 3662496011 ISBN 13: 9783662496015
Nuevo Taschenbuch

Librería: AHA-BUCH GmbH, Einbeck, Alemania

Calificación del vendedor: 5 de 5 estrellas Valoración 5 estrellas, Más información sobre las valoraciones de los vendedores

Taschenbuch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - X-Ray fluorescence analysis is an established technique for non-destructive elemental materials analysis. This book gives a user-oriented practical guidance to the application of this method. The book gives a survey of the theoretical fundamentals, analytical instrumentation, software for data processing, various excitation regimes including gracing incidents and microfocus measurements, quantitative analysis, applications in routine and micro analysis, mineralogy, biology, medicine, criminal investigations, archeology, metallurgy, abrasion, microelectronics, environmental air and water analysis. This book is the bible of X-Ray fluorescence analysis. It gives the basic knowledge on this technique, information on analytical equipment and guides the reader to the various applications. It appeals to researchers, analytically active engineers and advanced students. Nº de ref. del artículo: 9783662496015

Contactar al vendedor

Comprar nuevo

EUR 748,99
Envío por EUR 66,70
Se envía de Alemania a Estados Unidos de America

Cantidad disponible: 1 disponibles

Añadir al carrito

Imagen del vendedor

Burkhard Beckhoff
ISBN 10: 3662496011 ISBN 13: 9783662496015
Nuevo Taschenbuch
Impresión bajo demanda

Librería: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Alemania

Calificación del vendedor: 5 de 5 estrellas Valoración 5 estrellas, Más información sobre las valoraciones de los vendedores

Taschenbuch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -X-Ray fluorescence analysis is an established technique for non-destructive elemental materials analysis. This book gives a user-oriented practical guidance to the application of this method. The book gives a survey of the theoretical fundamentals, analytical instrumentation, software for data processing, various excitation regimes including gracing incidents and microfocus measurements, quantitative analysis, applications in routine and micro analysis, mineralogy, biology, medicine, criminal investigations, archeology, metallurgy, abrasion, microelectronics, environmental air and water analysis. This book is the bible of X-Ray fluorescence analysis. It gives the basic knowledge on this technique, information on analytical equipment and guides the reader to the various applications. It appeals to researchers, analytically active engineers and advanced students. 904 pp. Englisch. Nº de ref. del artículo: 9783662496015

Contactar al vendedor

Comprar nuevo

EUR 748,99
Envío por EUR 23,00
Se envía de Alemania a Estados Unidos de America

Cantidad disponible: 2 disponibles

Añadir al carrito

Imagen de archivo

Publicado por Springer, 2006
ISBN 10: 3662496011 ISBN 13: 9783662496015
Nuevo Tapa blanda

Librería: California Books, Miami, FL, Estados Unidos de America

Calificación del vendedor: 5 de 5 estrellas Valoración 5 estrellas, Más información sobre las valoraciones de los vendedores

Condición: New. Nº de ref. del artículo: I-9783662496015

Contactar al vendedor

Comprar nuevo

EUR 783,55
Gastos de envío gratis
Se envía dentro de Estados Unidos de America

Cantidad disponible: Más de 20 disponibles

Añadir al carrito

Imagen de archivo

Beckhoff, Burkhard (Editor)/ Kanngieser, Birgit (Editor)/ Langhoff, Norbert (Editor)/ Wedell, Reiner (Editor)/ Wolff, Helmut (Editor)
Publicado por Springer Verlag, 2006
ISBN 10: 3662496011 ISBN 13: 9783662496015
Nuevo Paperback

Librería: Revaluation Books, Exeter, Reino Unido

Calificación del vendedor: 5 de 5 estrellas Valoración 5 estrellas, Más información sobre las valoraciones de los vendedores

Paperback. Condición: Brand New. 2006 edition. 878 pages. 9.25x6.10x2.01 inches. In Stock. Nº de ref. del artículo: x-3662496011

Contactar al vendedor

Comprar nuevo

EUR 1.026,47
Envío por EUR 17,24
Se envía de Reino Unido a Estados Unidos de America

Cantidad disponible: 2 disponibles

Añadir al carrito