Future education National Computer Rank Examination written test a pass: two C language exclusively paperless examination (2013) (with CD 1)(Chinese Edition)

Ship out in 2 business day, And Fast shipping, Free Tracking number will be provided after the shipment.Paperback. Pub Date: 2013 Pages: 231 Language: Chinese in Publisher: People's Posts and Telecommunications Press Computer Rank Examination the NCRE proposition Research Center. and the future of education teaching and research center jointly passed in the shortest possible time in order to help candidates design and development of the book. The future education National Computer Rank Examination written test a pass: two C language (2013 the paperless examination only) Chapter 15. the main contents include: exam guide. public basic knowledge of C Language Overview operator expression . basic statements. select the structure. looping structures. arrays. functions. pointers. the compiler pre-processing and dynamic storage allocation. structure and union documents. high-frequency test centers operating questions succinctly and paperless real test exam. Future Education National Computer Rank Examination written test a pass: two C language (the paperless examination only in 2013) with disc including multimedia classroom and mock examinations system. The multimedia classroom multimedia to explain the focus and difficulty of the exam. candidates to further strengthen the consolidation of knowledge in a relaxed learning environment. The simulation test system lead candidates to advance into the examination room. automatic scoring function to enable candidates to understand their knowledge levels. The book is the perfect combination of CD-ROM. to provide real help to pass the exam for the candidates. Future education National Computer Rank Examination written test a pass: two C language (2013 the paperless examination only) as the NCRE two c language subjects training materials and self-study book. and can also be used as learning two c language reference books. Contents: Chapter 0 Exam Guide 0.1 exam Chapter 1 the environment Introduction 0.2 exam process demo Public basics 1.1 data structures and algorithms test center an algorithm test sites 2 data structures the basic concepts of test sites 3 linear table and their order storage structure of 4 stack test sites and the queue test center the 5 linear list test sites 6 tree and binary tree test sites (7) technology test center sorting at 9 programming methods and style test 1.2 program design based on test sites 10 the structured programming test sites 11 object-oriented program design 1.3 software engineering the foundation test sites 12 18 data model test sites 19 of the basic concepts of software engineering test center at 13 structured analysis method test the 14 structured design methodology test sites 15 software testing test sites 16 program debugging 1.4 database design the foundation test sites 17 test sites of the basic concepts of database systems relational algebra test sites 20 database design Management 1.5 integrated self-test Chapter 2 Overview of the C language the 2.1 language basics test sites 1 C Language Overview language test centers 2C constitute 2.2 constants. variables and data types the constant identifier test sites 4 test sites variable 2.3 self-test of the test sites Chapter 3 computing 4 basic arithmetic operators of the character expression 3.1 C language operators test sites at 1 C language operators Profile test the combination of the two operators and the priority test sites 3 comma operator and comma expression 3.2 arithmetic operators and arithmetic expressions test sites test sites arithmetic expressions and operator priority and associativity test sites from Canada. the decrement operator the 3.3 assignment operator and assignment expression test sites 7 assignment operator and assignment expression test center the 8 compound assignment operators test sites 9 mandatory 2 character output type conversion operator and assignment operator type conversion 3.4 operational test center 10 operators and bit computing Chapter 4 3.5 integrated self-test t.…