A Designer's Guide to Built-In Self-Test

Idioma: inglés

Editorial: Springer US, Springer New York Mär 2013, 2013

1475776268 / 9781475776263

Serie: Libro 8 de 40 - Frontiers in Electronic Testing

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Librería: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, AlemaniaBuchWeltWeit Ludwig Meier e.K.

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This item is printed on demand - it takes 3-4 days longer - Neuware -A recent technological advance is the art of designing circuits to test themselves, referred to as a Built-In Self-Test (BIST). This idea was first proposed around 1980 and has grown to become one of the most important testing techniques at the current time, as well as for the future. This book is written from a designer's perspective and describes the major BIST approaches that have been proposed and implemented since 1980, along with their advantages and limitations. The BIST approaches include the Built-In Logic Block Observer, pseudo-exhaustive BIST techniques, Circular BIST, scan-based BIST, BIST for regular structures, BIST for FPGAs and CPLDs, mixed-signal BIST, and the integration of BIST with concurrent fault detection techniques for on-line testing. Particular attention is paid to system-level use of BIST in order to maximize the benefits of BIST through reduced testing time and cost as well as high diagnostic resolution. The author spent 15 years as a designer at Bell Labs where he designed over 20 production VLSI devices and 3 production circuit boards. Sixteen of the VLSI devices contained BIST of various types for regular structures and general sequential logic, including the first BIST for Random Access Memories (RAMs), the first completely self-testing integrated circuit, and the first BIST for mixed-signal systems at Bell Labs. He has spent the past 10 years in academia where his research and development continues to focus on BIST, including the first BIST for FPGAs and CPLDs along with continued work in the area of BIST for general sequential logic and mixed-signal systems. He holds 10 US patents (with 5 more pending) for various types of BIST approaches. Therefore, the author brings a unique blend of knowledge and experience to this practical guide for designers, test engineers, product engineers, system diagnosticians, and managers. 344 pp. Englisch.…

N° de ref. del artículo 9781475776263

Título
A Designer's Guide to Built-In Self-Test
Autor
Charles E. Stroud
Editorial
Springer US, Springer New York Mär 2013
Año de publicación
2013
Estado
Neu
Encuadernación
Taschenbuch
Idioma
inglés
ISBN 10
1475776268
ISBN 13
9781475776263
Peso del artículo
522 gramos
Dimensiones
235x155x19 mm
Serie
Libro 8 de 40: Frontiers in Electronic Testing

BuchWeltWeit Ludwig Meier e.K.

Bergisch Gladbach, Alemania

Vendedor de 5 estrellas

Vendedor de IberLibro desde 11 de enero de 2012

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ArtículoDe 5 a 15 días hábilesDe 5 a 15 días hábiles
Primer artículoEUR 23,00EUR 23,00
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BuchWeltWeit Ludwig Meier e.K.

Alemania

BuchWeltWeit Inh. Ludwig Meier e.K.
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